Skhynix Inc.

Sung Yong Lim

Seung Hwan Baek

Jae Il Tak

Yeon Ji Shin

A memory device includes a memory block, peripheral circuit, and control logic. The memory block includes a plurality of pages coupled to a plurality of word lines, respectively. The peripheral circuit is configured to perform a program loop including a program pulse operation of applying a program voltage to a selected word line, and a verify operation of applying at least one verify voltage corresponding to the program voltage to the selected word line and applying a verify pass voltage to unselected word lines. The control logic is configured to increase a level of the verify pass voltage applied to at least one unselected word line among the unselected word lines whenever the peripheral circuit performs the next program loop when threshold voltages of memory cells included in a page coupled to the selected word line are greater than a reference level.

Memory device preventing generation of under-programmed memory cell, memory system including the same and operating method thereof

There are provided a memory device and an operating method of the memory device. The memory device includes: a memory block including first select transistors, memory cells, and second select transistors, which are connected between bit lines and a source line; a precharge controller for monitoring a program operation of the memory cells, and changing a precharge mode of unselected strings among strings included in the memory block according to a monitoring result; and a select line voltage generator for generating a positive voltage or a negative voltage, which is applied to a second select line connected to the second select transistors, according to the precharge mode selected in the precharge controller.

Memory device and operating method of the memory device

Improving reliability of verify operation for verifying program pulse operation of NAND flash memory device

A memory device includes a memory block, a peripheral circuit, and control logic. The memory block includes memory cells. The peripheral circuit performs a program operation including a plurality of program loops. Each of the plurality of program loops includes a program pulse application operation and a verify operation. The control logic controls the peripheral circuit to store cell status information and apply a program limit voltage. The control logic sets a verify pass reference and applies the program limit voltage determined based on the cell status information.

Memory device and operating method for performing verify operation

A memory device includes a memory block including a plurality of stacked sub-memory blocks, peripheral circuits configured to perform program, read and erase operations on the memory block or on a block selected from among the sub-memory blocks, and a control logic configured to control the peripheral circuits so that, during a read operation on the memory block, if a block on which a partial erase operation has been performed is not present among the sub-memory blocks, voltages to be used for the read operation are set and so that, if a block on which the partial erase operation has been performed is present among the sub-memory blocks, the voltages to be used for the read operation are varied depending on a position of a sub-memory block that is a target of the read operation.

Memory device and method of operating the same to prevent occurrence of read fail by adjusting bit line voltage

A semiconductor memory device may include a memory cell array, a plurality of page buffers respectively connected to a plurality of bit lines of the memory cell array, and a control logic configured to control the plurality of page buffers to perform an operation on the memory cell array, wherein each of the plurality of page buffers senses a current amount, which varies according to a potential level of a corresponding bit line among the plurality of bit lines, at a sensing node to read data, and a precharge potential level at the sensing node is adjusted according to a temperature.

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Uiwang-si, South Korea

Sung Yong Lim