Hon Hai Precision Industry Co., Ltd.

Hong-fu Jin Precision Industry (shenzhen) Co., Ltd.

Scienbizip Consulting(shenzhen)co., Ltd.

Sung-Kuo Ku

Cho-Hao Wang

Wei-Yuan Chen

Ming-Shiu Ou Yang

Qi-Sheng Xu

Ming-Tao Wei

Xiong-Zhi Chen

An over-current protection circuit includes a first connector, a first current measuring unit, a first switch unit, a first resistor unit, and a second connector. The first connector is electrically coupled to a power supply unit (PSU). When a current of the first resistor unit measured by the first current measuring unit is less than a first reference value, the first switch unit is turned on, and the second connector receives a first power supply from the PSU. When the current of the first resistor unit measured by the first current measuring unit is greater than or equal to the first reference value, the first switch unit is turned off, and the second connector does not receive the first power supply from the PSU.

Electronic device and over-current protection circuit thereof

A circuitry testing module for testing an external circuit of a Light-Emitting Diode (LED) includes at least one logic unit and a latch circuit. Two input terminals of the at least one logic unit are connected to a first end and a second of the LED correspondingly. The output terminal of the at least one logic unit is connected to the latch circuit. If the external circuit works normally, the logic unit outputs a first logic operating signal to the latch unit, and the latch circuit outputs a first latch signal. If the external circuit does not work normally, the logic unit outputs a second logic operating signal to the latch unit, and the latch circuit outputs a second latch signal.

Circuitry testing module and circuitry testing device

A system for measuring performance of a voltage regulator module (VRM) attached to a microprocessor includes: a voltage transient tester (VTT) fixture () for setting different working voltage levels of the VRM; an oscillograph () for measuring transient voltage levels of the VRM, and generating a transient voltage waveform according to the transient voltage levels; an voltmeter () for measuring steady voltage levels of the VRM under thermal effects generated by the microprocessor; a direct current (DC) electronic load () for educing load currents from the VRM; and a measurement control module () installed in a computer () for generating load current control signals, controlling the DC electronic load to educe the load currents from the VRM according to the load current control signals, and generating a performance report of the VRM by integrating various measurement results.

System and method for measuring performance of a voltage regulator module attached to a microprocessor

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Taipei, Taiwan

Sung-Kuo Ku