Lg Display Co., Ltd.

Samsung Electronics Co., Ltd.

Sung-Joong Kim

Kyung-Ho Jung

Sang-Kil Lee

Kwang-Sik Kim

Min-Sub Kang

Yun-Seo Park

Jong-Hag Kim

Sin-Kyun Park

Jung-Tack Eu

The present invention relates to a back light unit for a liquid crystal display device, which can improve safety and reliability of the back light unit; and a method for fabricating the same. The back light unit for a liquid crystal display device includes lamps for supplying a light to a liquid crystal display panel, a printed circuit board of a non-conductive plastic having sockets mounted thereto for supplying a high voltage to the lamps, a cover bottom fastened to the printed circuit board, having the lamps received therein, and a hook shaped projection formed as one unit with the printed circuit board for placing in a hole in the cover bottom for fastening the printed circuit board to the cover bottom.

Back light unit for liquid crystal display device and method for fabricating the same

Disclosed is a liquid crystal display device equipped with a balance insulating member having a bottom frame and lamp sockets integrally formed on the bottom frame, including: a lower cover; a plurality of lamps disposed on the lower cover with a certain interval therebetween; a balance insulating member disposed at both sides of the lower cover, and having a bottom frame and lamp sockets integrally formed on the bottom frame so as to be coupled to the lamps; and a liquid crystal panel disposed above the lamps and receiving light, wherein the balance insulating member includes conductive electrodes formed at the lamp sockets, ballast capacitors each connected to the conductive electrodes and disposed on an upper side of the bottom frame, and conductive wirings formed inside the bottom frame and connected to the ballast capacitors.

Liquid crystal display device

Disclosed is an LCD device having molding-type substrates formed so as to have a controllable thickness through simplified fabricating processes. The LCD device comprises: a lower cover; a plurality of lamps disposed on the lower cover with a constant interval therebetween, and providing light; molding-type substrates disposed at both sides of the lower cover, and having lamps coupled thereto; and an LC panel disposed on the lamps, and receiving light, wherein each of the molding-type substrates comprises: a conductive wire to which a voltage is supplied from outside; grippers integrally formed on the conductive wire with a constant interval therebetween, and coupling the lamps; and a bar-shaped mold frame including the conductive wire therein, and exposing the grippers to outside.

Liquid crystal display device with particular molding-type substrates

A pattern is inspected by acquiring a scanning electron microscope picture of an inspection pattern, and acquiring a scanning electron microscope secondary electron signal profile of the inspection pattern. A determination is made as to whether the inspection pattern is defective by comparing the scanning electron microscope picture of the inspection pattern to a scanning electron microscope picture of a sample pattern, and by comparing the scanning electron microscope secondary electron signal profile of the inspection pattern to a scanning electron microscope secondary electron signal profile of a sample pattern.

Methods, systems and computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles

A dual core transformer including a bobbin having a through-hole along a first direction; a first coil wound around a first portion of the bobbin; a second coil wound around a second portion of the bobbin; first and second I cores inserted into the through-hole; and first and second C cores covering the first and second portions of the bobbin.

Dual core transformer and backlight driving unit for liquid crystal display device including the same

Computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles

Methods and systems for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles

Growing community of inventors

Gyeonggi-do, South Korea

Sung-Joong Kim