Samsung Electronics Co., Ltd.

Sung-Ii Chang

Jae-Hoon Lee

Changhyun Lee

Byoungkeun Son

Chan-Ho Lee

Hyeong-Mo Yang

Nok-Hyun Ju

A metal-oxide-semiconductor field-effect transistor device includes a first active area, a first gate electrode configured to cross the first active area and extend in a Y direction, and define a first source area and a first drain area, first gate contacts disposed on the first gate electrode to align on a first virtual gate passing line extending in the Y direction, first source contacts disposed on the first source area to align on a first virtual source passing line extending in the Y direction, and first drain contacts disposed on the first drain area to align on a first virtual drain passing line extending in the Y direction, wherein at least one of the first drain contacts is disposed to align on any one of first virtual X-straight lines configured to pass between the first source contacts and extend parallel in an X direction perpendicular to the Y direction.

Layouts and vertical structures of MOSFET devices

A nonvolatile memory device includes a substrate, a stacked structure with conductive materials and first insulating materials and the conductive materials and the first insulating materials are alternately stacked on the substrate, and a plurality of pillars in contact with the substrate and the pillars extend through the stacked structure in a direction perpendicular to the substrate. The device also includes information storage layers between the conductive materials and the first insulating materials, and second insulating materials between the first insulating materials and the pillars.

Nonvolatile memory device in three-dimensional structure with a stress reducing materials on the channel

Growing community of inventors

Hwaseong-si, South Korea

Sung-Ii Chang