Skhynix Inc.

Sung Hwa Hong

Tae Heui Kwon

Byung Goo Cho

Provided herein may be a memory device for performing a bad block check, a method of operating the memory device, and a method of operating a storage controller communicating with the memory device. The memory device may include a first area including a first memory cell, a second area including a second memory cell, the first memory cell and the second memory cell coupled to an identical word line, and a control circuit configured to perform a first operation on the first area and a second operation on the second area and configured to store a first result indicating whether the first operation has succeeded and a second result indicating whether the second operation has succeeded.

Memory device for performing bad block check, method of operating memory device, and method of operating storage controller communicating with memory device

Growing community of inventors

Icheon-si Gyeonggi-do, South Korea

Sung Hwa Hong