Samsung Electronics Co., Ltd.

Sung Ho Suh

Young Tae Jang

Jin Ho Seo

Seog Heon Ham

Se Jun Kim

Hyeok Jong Lee

Byung Jo Kim

Seung Hyun Lim

Kwi Sung Yoo

Han Vit Yang

Yong Kyun Lim

Kyoung Min Koh

Yu Jin Park

Jae Cheol Yun

Jae Jin Jung

Jin Young Jeong

An image sensor includes a pixel array and N analog-to-digital converters (ADCs). The pixel array includes N pixels arranged in each of a plurality of rows, and each of the N pixels include M photoelectric conversion elements. At least one of the N ADCs are shared by at least one of the M photoelectric conversion elements included in each of the N pixels.

Image sensor, data processing system including the same

An image sensor including a comparator configured to generate a comparison signal by comparing a ramp signal and a pixel signal with each other, a counter configured to generate a digital pixel value by counting an input clock signal according to the comparison signal, and a divider configured to control a frequency of the input clock signal according to an analog gain of the image sensor.

Image sensor and image processing system including the same

An image sensor operating in a skip mode and reading out a pixel signal provided by at least one of a plurality of pixels and compensating for fixed pattern noise (FPN) in column-parallel pipelines. The image sensor includes; a switch signal generator that generates a first switch control signal and a second switch control signal in response to FPN location information characterizing a first pipeline among the column-parallel pipelines as a noisy pipeline generating FPN, and characterizing a second pipeline among the column-parallel pipelines as a quiet pipeline not generating FPN, a binning switch block including a first switch controlled by the first switch control signal and a second switch controlled by the second switch control signal, wherein the first switch control signal causes the first pipeline to be inactivated and the second switch control signal causes the second pipeline to be activated, and a binning block that performs a digital binning operation on digital signals provided via the column-parallel pipelines including the second pipeline.

Image sensor and image processing system that compensate for fixed pattern noise (FPN)

In one embodiment, an image sensor includes a pixel array including a plurality of pixels, an analog-to-digital converter configured to convert analog pixel signals output from the pixels into digital signals, a first cluster configured to store a first group of digital signals among the digital signals and to output first image data, a second cluster configured to store a second group of digital signals among the digital signals and to output second image data, and at least one cluster switch connected to the first cluster and the second cluster, a first channel, and a second channel. The image sensor is configured to transmit at least one among the first image data and the second image data to at least one among the first channel and the second channel based on an operation mode.

Image sensor for controlling a transmission speed of sensed image data and image processing system including the same

An image sensor includes a first column pair and a second column pair among a plurality of columns of a pixel array, an analog-to-digital converter pair, and a switch arrangement circuit configured to connect the first column pair with the analog-to-digital converter pair in response to first switch control signals such that two rows among a plurality of rows in the pixel array are read during a single access time.

Image sensor and system including the same

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Hwaseong-si, South Korea

Sung Ho Suh