Skhynix Inc.

Sung Dae Choi

You Sung Kim

Nam Kyeong Kim

Jae Hyeon Shin

Min Su Kim

A semiconductor device and a method of operating the same are provided. The semiconductor device includes a memory block including a plurality of pages having a plurality of first cells and a plurality of second cells, a circuit group configured to read first cells and second cells of a selected page of the pages a strobe signal control circuit configured to store source bouncing information generated during a read operation of the first cells of the selected page and output a strobe signal based on stored information, and a control circuit configured to control the circuit group in response to the strobe signal during a read operation of the second cells of the selected page.

Semiconductor device and operating method thereof

A semiconductor memory device and an operating method thereof are provided. The semiconductor memory device includes a memory cell array including a plurality of memory groups each including at least a drain-select transistor and a plurality of memory cells, a voltage generator suitable for generating a read voltage that is to be applied to a selected memory cell of the memory cells and a pass voltage that is to be applied to unselected memory cells other than the selected memory cell among the memory cells, and a control logic suitable for controlling the voltage generator to generate the pass voltage to have different levels depending on a distance between the drain-select transistor and the selected memory cell during a read operation.

Semiconductor memory device and operating method thereof

A nonvolatile memory apparatus includes: a memory cell array including a plurality of unit memory cells; a page buffer unit configured to read data from a selected memory cell of the memory cell array and store the read data; a controller configured to generate a reference current generation signal, a first current control signal, and a second current control signal, which correspond to the number of fail bits to be sensed and a deviation in cell current amounts flowing through the unit memory cells during a read operation, in response to a verification command; and a fail bit sensing unit configured to receive the reference current generation signal, the first current control signal, and the second current control signal from the controller in response to the verification command, and control at least one of a reference current amount and a data read current amount of the page buffer unit.

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Chungcheongnam-do, South Korea

Sung Dae Choi