Taiwan Semiconductor Manufacturing Comp. Ltd.

Sung-Chieh Lin

Kuoyuan (Peter) Hsu

Wei-Li Liao

Jiann-Tseng Huang

David Yen

Kuoyuan Hsu

Po-Hung Chen

Hung-Jen Liao

Chen-Ming Hung

Yun-Han Chen

Fu-Lung Hsueh

Yen-Chieh Huang

Bing Wang

Chun-Chih Lin

Ming-Hsien Tsai

Chin-Huang Wang

Kuo-Yuan Hsu

Kai Fan

Shao-Cheng Wang

Chi-Hsu Chiu

We-Li Liao

Chun-Keng Hsu

Chao-Lin Lee

A memory device includes a memory array that comprises at least a bit cell configured to store a data bit; a tracking circuit, coupled to the memory array, and configured to provide an enable signal in response to a first timing edge of a clock signal, wherein the enable signal emulates an electrical signal path propagating the memory array; and a control logic circuit comprising a timing control engine coupled to the tracking circuit, wherein the timing control engine is configured to select a faster timing edge between a second timing edge of the clock signal and a third timing edge of the enable signal so as to terminate an ongoing operation of the bit cell.

Memory device with determined time window

A method for forming an integrated circuit includes forming a deep n-well (DNW) in a substrate, and forming a PMOS transistor in the DNW. The method also includes forming an NMOS transistor in the substrate and outside the DNW, and forming a reverse-biased diode. The method further includes forming an electrical path between a drain of the PMOS transistor and a gate structure of the NMOS transistor. The dissipation device is also connected to the electrical path.

Integrated circuit structure

A circuit includes a fuse cell, a sense circuit and an output control circuit. The fuse cell includes an electrical fuse. The sense circuit is electrically coupled to the fuse cell and configured for generating a sense signal indicative of a programmed condition of the electrical fuse, at an output of the sense circuit. The output control circuit is electrically coupled to the output of the sense circuit, and the output control circuit is configured for latching the sense signal indicative of the electrical fuse having been programmed, during a read operation of the fuse cell.

Generating stabilized output signals during fuse read operations

Integrated circuit structure to resolve deep-well plasma charging problem and method of forming the same

A circuit comprises a first transistor, a capacitive component, a second transistor, and a data line. The first transistor has a threshold voltage value. A first terminal of the first transistor is coupled with a first terminal of the capacitive component and a second terminal of the second transistor. A second terminal of the first transistor is configured to receive a second-terminal voltage value. A third terminal of the first transistor is configured to receive a third-terminal voltage value. A first terminal of the second transistor is coupled with the data line. A third terminal of the second transistor is configured to receive a second-transistor control signal. The first transistor is configured to be on and off to maintain the data line at a data line voltage value.

Writing data to a memory cell

A method includes reading data from a subset of a plurality of memory bit cells of a non-volatile memory. The data identifies an address of at least one individual failed bit cell. The method further includes loading the data directly into a register, receiving an address of data to be accessed, determining if the received address is the address of any individual failed bit cell; and accessing the data of the register if the received address is the address of any individual failed bit cell.

Method and apparatus for bit cell repair

A method includes, by a first circuit, converting a plurality of bits in a first format to a second format. The plurality of bits in the second format is used, by a second circuit, to program a plurality of memory cells corresponding to the plurality of bits. The first format is a parallel format. The second format is a serial format. The first circuit and the second circuit are electrically coupled together in a chip. In some embodiments, the plurality of bits includes address information, cell data information, and program information of a memory cell that has an error. In some embodiments, the plurality of bits includes word data information of a word and error code and correction information corresponding to the word data information of the word.

Memory error correction

In a method, a current value of a memory cell of a tracked circuit is determined. The memory cell is coupled with a data line. A tracking current value of a tracking memory cell of a tracking circuit is determined. The tracking memory cell is coupled with a tracking data line. A current value of a transistor of the tracking circuit is determined, based on a current value of a transistor of the tracked circuit, the current value of the memory cell, and the tracking current value of the tracking memory cell. A signal of the tracked circuit is generated based on a signal of the tracking circuit.

Tracking mechanism

During various processing operations, ions from process plasma may be transfer to a deep n-well (DNW) formed under devices structures. A reverse-biased diode may be connected to the signal line to protect a gate dielectric formed outside the DNW and is connected to the drain of the transistor formed inside the DNW.

The embodiments of methods and structures disclosed herein provide mechanisms of forming and programming a metal-via fuse. The metal-via fuse and a programming transistor form a one-time programmable (OTP) memory cell. The metal-via fuse has a high resistance and can be programmed with a low programming voltage, which expands the programming window.

Metal-via fuse

A method of reading an eFuse in a column of eFuse memory cells includes electrically disconnecting a first end of the eFuse from a first electrical path. A second electrical path between a second end of the eFuse and a node is activated to bypass a third electrical path, where the third electrical path includes a diode device between the second end of the eFuse and the node. A footer coupled with the node is turned on.

Electrical fuse memory

A word line driver including a control switch configured to receive a control signal, where the control switch is between a first node configured to receive an operating voltage signal and a second node configured to determine an output of the word line driver. The word line driver further includes a cross-coupled amplifier electrically connected to the second node. The word line driver further includes at least one inverter electrically connected to the cross-coupled amplifier. A semiconductor device including the word line driver and a memory array including at least one electronic fuse.

Word line driver having a control switch

A circuit includes a fuse circuit and a control circuit. The fuse circuit has an electrical fuse. The control circuit is configured to receive an input signal having an input pulse, and, based on a feedback signal from the fuse circuit, generates a read pulse smaller than the input pulse for use in reading the data stored in the electrical fuse.

Circuit and method for generating a read signal

A mechanism of reconfiguring an eFuse memory array to have two or more neighboring eFuse bit cells placed side by and side and sharing a program bit line. By allowing two or more neighboring eFuse bit cells to share a program bit line, the length of the program bit line is shortened, which results in lower resistivity of the program bit line. The width of the program bit line may also be increased to further reduce the resistivity of program bit line. Program bit lines with low resistance and high current are needed for advanced eFuse memory arrays using low-resistivity eFuses.

Electrical fuse memory arrays

An amplifying circuit comprises a bias circuit, a reference circuit, a first circuit, and an amplifying sub-circuit. The bias circuit is configured to provide a bias current. The reference circuit is configured to provide a first differential input based on a reference resistive device and a reference current derived from the bias current. The first circuit is configured to provide a second differential input based on a first current and a first resistance. The amplifying sub-circuit is configured to receive the first differential input and the second differential input and to generate a sense amplifying output indicative of a resistance relationship between the first resistance and a resistance of the reference resistive device.

Growing community of inventors

Zhubei, Taiwan

Sung-Chieh Lin