Ohara, Inc.

Nagaoka University of Technology

National Institute of Technology

National University Corporation Nagaoka University of Technology

National University Corporation Nagaoka University

Sunao Chatani

Motohiro Tagaya

Masahiko Inui

Satoshi Motozuka

Takuya Kataoka

The present invention provides a crystal of a europium compound containing europium. The present invention enables the preparation of a crystal of a europium compound having a powder X-ray diffraction pattern having a first diffraction peak in diffraction angle (2θ) range of 34.3° to 36.1° in which a half width of the first diffraction peak is 1.8° or less, and/or having a second diffraction peak in diffraction angle (2θ) range of 28.6° to 29.6° and a third diffraction peak in diffraction angle (2θ) range of 36.8° to 38.4° in which a half width of the second diffraction peak is 1.0° or less and a half width of the third diffraction peak is 1.6° or less, and

Crystal of europium compound and method for producing crystal of europium compound

The purpose of the present invention is to provide a cell culture substratum which has excellent resistance to liquid culture media and low cytotoxicity, can achieve a high cell adhesion ratio and a high viability of cultured cells, has excellent thermal stability, and is less likely to absorbs ultraviolet ray. A cell culture substratum which is provided with a substrate made from an inorganic material and has multiple concavo-convex structures on a culturing surface thereof, wherein, when the concavo-convex structures are measured with an atomic force microscope in accordance with JISB0601 and JISR1683 (measured area: a 1 &#x3bc;m-square, cut-off value of a low-pass contour curve filter: 1 nm, cut-off value of a high-pass contour curve filter: 170 nm), the average of the lengths of contour curve elements of the concavo-convex structures is 1 to 170 nm as measured in at least one direction (when a curve showing long-wavelength components that are blocked by the high-pass contour curve filter is converted to a straight line by the least square method, the average line is a line that is parallel with the straight line and indicates a height cumulative relative frequency distribution in the contour curve of 50%).

Cell culture substratum, method for producing cell-containing material, method for producing cell culture substratum, method for observing cells, and cell culture substratum maintenance fluid

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Wakayama, Japan

Sunao Chatani