Samsung Electronics Co., Ltd.

Sun-woo Lee

Myung-ho Kyung

Thomas Byunghak Cho

Dooseok Choi

Young-Moon Choi

Seung-chan Heo

Won-chul Jung

Byung-kyu Kim

Shinich Hisatomi

Dae-young Yoon

A method of testing a radio frequency (RF) integrated circuit includes: forming, performed by the RF integrated circuit, a test loop that passes through a first transceiver circuit, a first front-end circuit, and a second transceiver circuit, based on a test control signal transmitted from a test device; adjusting, performed by the RF integrated circuit, a shift degree of at least one phase shifter in the first front-end circuit, based on the test control circuit; and receiving, performed by the RF integrated circuit, a test input signal via the first transceiver circuit from the test device, and outputting, to the test device, the test input signal that has passed through the test loop, wherein the test input signal is output as a test output signal via the second transceiver circuit.

Method of testing RF integrated circuit

An image forming apparatus including a transfer unit that transfers onto a transfer medium an image that is formed on a photosensitive medium; a power supply unit that provides a transfer power to the transfer unit; and a transfer power control unit that controls the transfer power that is provided to the transfer unit by the power supply unit. The transfer power control unit sets as a target voltage an output voltage of the power supply unit that is measured by supplying an initial transfer current to the transfer unit in a predetermined certain period before an image is transferred onto the transfer medium and controls the power supply unit to apply the set target voltage to the transfer unit while an image is being transferred onto the transfer medium.

Image forming apparatus and method of controlling transfer power thereof

An image forming apparatus may include: a plurality of image bearing members; an exposure unit; a developing unit; a transfer unit including a plurality of transfer rollers and a plurality of erasers each disposed between the transfer rollers; and a fixing unit. The eraser may be disposed in a zone Zsatisfying the following formula:1&#x2266;1&#x2266;3;1=4.5 mm;3=4.5 mm; and 9.0 mm&#x3c; Here, Dmay be an allowable minimum distance between an end part of the eraser and a center of a first transfer nip between a first image bearing member and a first transfer roller; Dmay be an allowable minimum distance between the end part of the eraser and a center of a second transfer nip between a second image bearing member and a second transfer roller; and D may be a distance between the centers of the transfer nips.

Image forming apparatus which can prevent inferior image quality due to current leakage

An image forming apparatus includes a static electricity eliminator to remove residual charge from a printing medium. A selector is provided to connect the static electricity eliminator to ground through a selected resistance, and a controller is provided to control the selector depending on printing medium characteristics. The resistance in the ground path connected to the static electricity eliminator is changed according to printing medium characteristics such that elimination of residual charge is effective over a range of printing media having different printing medium characteristics.

Image forming apparatus and method thereof

Nano semiconductor switch devices are provided that include a semiconductor substrate and a conductive layer on the semiconductor substrate. A first insulating layer is provided on the conductive layer and the semiconductor substrate. The first insulating layer defines a contact hole that exposes at least a portion of the conductive layer. Carbon nano tubes are provided on the exposed portion of the conductive layer in the contact hole. The carbon nano tubes are in a vertical direction with respect to the semiconductor substrate. Related methods of fabrication are also provided herein.

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Hwaseong-si, South Korea

Sun-woo Lee