Samsung Electronics Co., Ltd.

Hyundai Motor Company

Sun-Won Kang

Seung-Duk Baek

Hyun-Soo Chung

Jong-joo Lee

Jong-Joo Lee

Jin-Chan Ahn

Dong-Ho Lee

Sang-Wook Park

Nam-seog Kim

Dong-ho Lee

Joong-Hyun Baek

Young-hee Song

Won-young Kim

Tae-Gyeong Chung

Hee-jin Lee

Seok-hong Kwon

Sang-nam Jeong

Jin-Woo Park

Jong-Ho Lee

Kang-Wook Lee

Joon-Young Park

Seung-Yong Cha

Kwang-Yong Lee

Seong-deok Hwang

Eun-Chul Ahn

Ho-Geon Song

Nam-Seog Kim

Chul Won Park

Dong-hyeon Jang

Yong-Chai Kwon

Kil-soo Kim

Keum-Hee Ma

Ji-Seok Hong

Hee-Jin Lee

Hwan-Sik Lim

Dong-Kil Shin

Jong-Gi Lee

Myung-Kee Chung

Hyo-Soon Kang

Kwang-Seok Kim

Tae-Young Yoon

Kyoung-Soo Kim

Yeo-Hoon Yoon

Gun-Ho Chang

Il-Joon Kim

Se-Young Yang

Doo-Hee Hwang

Moon-Jung Kim

Sung-ho Mun

Hyung-Gil Baek

Won-Suk Chun

Sang-Ryeol Park

Provided are a semiconductor device and a semiconductor package including the same. The semiconductor device comprises a semiconductor chip body including a first chip pad on a top surface, a passivation film disposed on the semiconductor chip body and a first redistribution layer that is disposed between the passivation film and the semiconductor chip body with an opening to expose a first chip center pad region at least partially overlapping the first chip pad, a first redistribution center pad region connected to the first chip center pad region, and a first edge pad region spaced apart from the first redistribution center pad region, through the passivation film, wherein a top surface of the first chip center pad region and a top surface of the first redistribution center pad region are not disposed on the same plane.

Semiconductor device and semiconductor package including the same

A semiconductor chip includes a semiconductor substrate, a through electrode, an inter-mediation pad, an upper pad, and a rewiring line. The semiconductor substrate includes a first surface that is an active surface and a second surface that is opposite to the first surface. The through electrode penetrates the semiconductor substrate and is disposed in at least one column in a first direction in a center portion of the semiconductor substrate. The inter-mediation pad is disposed in at least one column in the first direction in an edge portion of the second surface. The upper pad is disposed on the second surface and connected to the through electrode. The rewiring line is disposed on the second surface and connects the inter-mediation pad to the upper pad.

Semiconductor chip and semiconductor package including the same

A semiconductor package includes a package base substrate including bonding pads and a connection pads respectively on an upper surface and a lower surface of the package base substrate, four semiconductor chips attached onto the package base substrate, including a 1A semiconductor chip, a 1B semiconductor chip, a 2A semiconductor chip, and a 2B semiconductor chip, and each including a plurality of chip pads that are adjacent to a first edge of an upper surface of each of the 1A semiconductor chip, the 1B semiconductor chip, the 2A semiconductor chip, and the 2B semiconductor chip, and a bonding wire electrically connecting the chip pad and the bonding pad to each other, wherein the four semiconductor chips are disposed on the package base substrate such that first edges of the four semiconductor chips respectively face edges of the package base substrate that are different from each other.

Semiconductor package

A semiconductor package includes a printed circuit board, a resistor circuit, and first and second semiconductor chips. First and second pads are on a first surface of the printed circuit board, and external connection terminal is on a second surface of the printed circuit board. The resistor circuit has a first connection terminal connected to the first pad and a second connection terminal connected to the second pad. The first semiconductor chip is connected to the first pad and the second semiconductor chip is stacked on the first semiconductor chip and connected to the second pad. The printed circuit board includes a signal transfer line connecting a branch in the printed circuit board to the external connection terminal. A first transfer line connects the branch to the first pad. A second transfer line connects the branch to the second pad.

A semiconductor package includes a substrate; and first and second semiconductor chips sequentially disposed on the substrate so that active surfaces of the first and second semiconductor chips face each other, wherein the first and second semiconductor chips are center pad-type semiconductor chips each having I/O pads arranged in two columns to be adjacent to a central line thereof, and I/O pads of the second semiconductor chip are electrically connected directly to the substrate without intersecting the central line of the second semiconductor chip.

A printed circuit board (PCB) includes a base substrate including upper and lower surfaces, a plurality of solder ball pads separately formed on the lower surface of the base substrate in a radial direction and forming one or more radial pad groups, a plurality of first traces respectively connected to the plurality of solder ball pads and extending to an inside of the radial pad group, and a plurality of second traces respectively connected to the plurality of first traces and extending to an outside of the radial pad group.

Printed circuit board having traces and ball grid array package including the same

A semiconductor module may include a circuit substrate with a first die on the circuit substrate and a second die on the first die. The first die may include at least one first data input/output pad on a first peripheral portion of the first die and at least one first control/address pad on a third peripheral portion, the third peripheral portion being separate from the first peripheral portion of the first die. The second die may include at least one second data input/output pad on a second peripheral portion and at least one second control/address pad on a fourth peripheral portion. The second peripheral portion of the second die is not overlapped with the first peripheral portion of the first die in plan view. The fourth peripheral portion of the second die overlaps at least a portion of the third peripheral portion of the first die.

Semiconductor module

In an integrated circuit (IC) chip and a flip chip package having the same, no wiring line is provided and the first electrode pad does not make contact with the wiring line in a pad area of the IC chip. Thus, the first bump structure makes contact with the first electrode regardless of the wiring line in the pad area. The second electrode pad makes contact with the wiring line in a pseudo pad area of the IC chip. Thus, the second bump structure in the pseudo pad area makes contact with an upper surface of the second electrode at a contact point(s) spaced apart from the wiring line under the second electrode.

Integrated circuit chip and flip chip package having the integrated circuit chip

A semiconductor package includes a semiconductor chip stack disposed between first and second leads near first and second sides of the package and including a plurality of semiconductor chips, and a redistribution structure disposed on the semiconductor chip stack. At least one semiconductor chip of the semiconductor chip stack includes a plurality of first chip pads disposed near or closer to a third side of the package. The redistribution structure includes a first redistribution pad disposed near or closer to the first side and electrically connected to the first lead, a second redistribution pad disposed near or closer to the second side and electrically connected to the second lead, and a third redistribution pad disposed near or closer to the third side and electrically connected to a first one of the first chip pads and the first redistribution pad.

Integrated circuit packages having redistribution structures

A semiconductor chip includes a redistribution interconnect that is implemented by shorting bumps, and a semiconductor package and a system each including the semiconductor chip. The semiconductor chip includes a semiconductor substrate, a passivation film disposed on the semiconductor substrate, and a plurality of pseudo bumps disposed on the passivation film. Each pseudo bump is directly connected to adjacent pseudo bumps to form at least one redistribution interconnect.

Semiconductor chip, and semiconductor package and system each including the semiconductor chip

A chip stack package includes a plurality of chips that are stacked by using adhesive layers as intermediary media, and a through via electrode formed through the chips to electrically couple the chips. The through via electrode is classified as a power supply through via electrode, a ground through via electrode, or a signal transfer through via electrode. The power supply through via electrode and the ground through via electrode are formed of a first material such as copper, and the signal transfer through via electrode is formed of second material such as polycrystalline silicon doped with impurities. The signal transfer through via electrode may have a diametrically smaller cross section than that of each of the power supply through via electrode and the ground through via electrode regardless of their resistivities.

Chip stack package

A semiconductor chip including a termination resistance and a semiconductor module including the semiconductor chip. The semiconductor chip comprising a plurality of memory cells, the semiconductor chip including: at least one first center pads disposed on a center region of the semiconductor chip and connected to the plurality of memory cells; at least one first edge pads disposed on an edge region of the semiconductor chip and connected to a first transmission line of a semiconductor module; at least one second edge pads disposed on the edge region of the semiconductor chip and connected to a chipset voltage application unit of the semiconductor module; at least one first redistribution patterns connected between the at least one first center pads and the at least one first edge pads; and at least one second redistribution patterns connected between the at least one first edge pads and the at least one second edge pads, wherein an impedance of the at least one second redistribution patterns is impedance matched to an impedance of the first transmission line.

Semiconductor chip and semiconductor module including the semiconductor chip

A mounting substrate includes a substrate, a bonding pad and an induction heating pad. The bonding pad is formed on the substrate, and adhered to a solder ball to mount a semiconductor chip on the substrate. The induction heating pad is disposed adjacent to the bonding pad, the induction heating pad being induction heated by an applied alternating magnetic field to reflow the solder ball. The induction heating pad having a diameter greater than a skin depth in response to the frequency of the applied alternating magnetic field is selectively induction heated in response to a low frequency band of the alternating magnetic field. Accordingly, during a reflow process for a solder ball, the semiconductor chip may be mounted on the mounting substrate to complete a semiconductor package without damaging the mounting substrate, to thereby improve the reliability of the completed semiconductor package.

Mounting substrate

Growing community of inventors

Seoul, South Korea

Sun-Won Kang