Hynix Semiconductor Inc.

Skhynix Inc.

Sun Mo An

Shin Ho Chu

Sang Il Park

Jong Yeol Yang

Youk Hee Kim

A semiconductor integrated circuit capable of controlling test modes without stopping testing of the semiconductor integrated circuit is presented. The semiconductor integrated circuit includes a test mode control unit configured to produce, in response to address decoding signals, a plurality of test mode signals of a first group and a plurality of test mode signals of a second group. The test mode control unit selectively inactivates the test mode signals of the first group by providing a reset signal using the test mode signals of the second group. Therefore, the testing time of the semiconductor integrated circuit can be reduced by inactivating the previous test mode using the reset signal and by executing a new test mode without disconnecting the test mode state.

Semiconductor integrated circuit capable of controlling test modes without stopping test

A thermal code output circuit is provided, comprising a pulse signal generator configured to receive multiple period signals and generate a pulse signal in response to a test mode signal, a thermal code output unit configured to output multiple thermal codes in response to the pulse signal, and a strobing signal output unit configured to output the pulse signal or a reference voltage selectively as a strobing signal in response to the test mode signal.

Semiconductor memory device and thermal code output circuit capable of correctly measuring thermal codes

A semiconductor memory apparatus includes a counting control circuit and an address counting circuit. The counting control circuit is configured to generate a first counting start signal, a second counting start signal and a counting count signal in response to an auto-refresh signal, a voltage stabilization signal and a fuse control signal. The address counting circuit is configured to count a plurality of count addresses in response to the first counting start signal, and to count one or more specified count addresses from among the plurality of count addresses in response to the second counting start signal and the counting control signal.

Semiconductor memory apparatus

A self-refresh test circuit includes a test clock generation unit, a pulse generation unit, a period signal selection unit, and a self-refresh pulse control unit. The test clock generation unit divides a clock signal to generate a plurality of divided clock signals having different periods when a test enable signal is enabled, and outputs one of the plurality of divided clock signals as a selected clock signal. The pulse generation unit generates a test period signal in response to the selected clock signal. The period signal selection unit outputs one of the test period signal and a self-refresh period signal as a selected period signal. The self-refresh pulse control unit generates a self-refresh pulse in response to a self-refresh exit signal and the selected period signal.

Self-refresh test circuit of semiconductor memory apparatus

Disclosed probe test control circuit includes: a bank active circuit configured to generate a bank active signal in response to a bank address and bank-by-bank test control signals; and a mat active circuit configured to generate a mat-by-mat sub-wordline selection signal and provide the mat-by-mat sub-wordline selection signal to a selected memory bank, in response to a row address signal, a row address enable signal and a mat-by-mat test control signal.

Semiconductor memory apparatus and probe test control circuit therefor

In an anti-fuse repair control circuit, a semiconductor memory device is integrated into a multi-chip package to perform an anti-fuse repair. An anti-fuse repair control circuit includes a data mask signal input circuit, a cell address enable unit a repair enable unit, and a repair unit. The data mask signal input circuit receives and outputs a data mask signal upon receiving a test control signal for an anti-fuse repair. The cell address enable unit receives an anti-fuse repair address to enable a cell address of an anti-fuse cell to be repaired upon receiving the data mask signal outputted from the data mask signal input circuit. The repair enable unit codes the cell address and output a repair enable signal and a drive signal according to whether or not an anti-fuse cell corresponding to the cell address is enabled. The repair unit supplies a repair voltage to the anti-fuse cell when the repair enable signal, the address, and the drive signal are enabled.

Anti-fuse repair control circuit and semiconductor device including DRAM having the same

An address control circuit for a semiconductor memory apparatus so as to make a refresh operation test possible by designating a refresh address is presented. The circuit includes a buffer block, a decoder, and a latch block. The buffer block receives coding information coded testing address information in accordance to a test signal. The decoder generates a test refresh address by decoding the coding information. The latch block latches the test refresh address depending on the test signal.

Address control circuit of semiconductor memory apparatus

Disclosed are a thermal code transmission circuit and a semiconductor memory device using the same. The thermal code transmission circuit includes a select signal generator which generates a select signal in response to a first enable signal, a level signal generator which receives the first enable signal to generate a level signal, an update signal generator which receives the level signal and a first update signal to generate a second update signal, a latch unit which receives a thermal code in response to the second update signal and outputs the thermal code as an output thermal code, and a thermal code output unit which selectively outputs the output thermal code in response to the select signal.

Thermal code transmission circuit and semiconductor memory device using the same

A buffer is disclosed. The buffer may include a buffer controller for buffering a refresh signal enabled in an auto-refresh operation synchronously with an external clock signal, a logic circuit for performing a logic operation with respect to an output signal from the buffer controller and a specific signal to output a control signal, and an internal clock generator controlled by the control signal from the logic circuit for buffering the external clock signal and generating internal clock signals.

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Gyeonggi-do, South Korea

Sun Mo An