Average Co-Inventor Count = 1.47
ph-index = 4
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Samsung Electronics Co., Ltd. (13 from 131,611 patents)
2. Lg Chem, Ltd (1 from 8,327 patents)
14 patents:
1. 11256638 - Application processor supporting interrupt during audio playback, electronic device including the same and method of operating the same
2. 11216399 - Application processor for low power operation, electronic device including the same and method of operating the same
3. 11061465 - Application processor including low power voice trigger system with security, electronic device including the same and method of operating the same
4. 11044368 - Application processor supporting low power echo cancellation, electronic device including the same and method of operating the same
5. 10971154 - Application processor including low power voice trigger system with direct path for barge-in, electronic device including the same and method of operating the same
6. 10789190 - Application processor supporting interrupt during audio playback, electronic device including the same and method of operating the same
7. 10783887 - Application processor including low power voice trigger system with external interrupt, electronic device including the same and method of operating the same
8. 10754804 - Application processor for low power operation, electronic device including the same and method of operating the same
9. 9825267 - Lithium secondary battery and method for producing the same
10. 9137432 - Backside illumination image sensor, operating method thereof, image processing system and method of processing image using the same
11. 8055946 - Semiconductor IC incorporating a co-debugging function and test system
12. 7644310 - Semiconductor IC incorporating a co-debugging function and test system
13. 7458762 - Apparatus and method for positioning semiconductor substrate
14. 6601313 - System and method for detecting position of semiconductor wafer