Samsung Electronics Co., Ltd.

Suklae Kim

Yoonyoung Choi

Seungjin Kim

Sejin Park

Sangki Lee

Byunghyun Lee

Hyukwoo Kwon

Yoonho Son

Teaseog Um

Sungsoo Yim

Seungjoong Shin

Hyuewon Lee

Insik Kim

Yoonoh Han

An integrated circuit semiconductor device includes a plurality of cylindrical structures separated from each other on a substrate; and a plurality of supporters having an opening region exposing side surfaces of the plurality of cylindrical structures, the plurality of supporters being in contact with the side surfaces of the plurality of cylindrical structures and supporting the plurality of cylindrical structures, wherein each of the plurality of supporters has both side surfaces having slopes and has a top width that is less than a bottom width.

Integrated circuit semiconductor device

A semiconductor device includes a memory cell storing data. The memory cell capacitor includes a plurality of bottom electrodes on a substrate and extending in a vertical direction with respect to a top surface of the substrate, the plurality of bottom electrodes being spaced apart from each other in a first direction parallel to the top surface of the substrate, an upper support pattern on upper lateral surfaces of the plurality of bottom electrodes, and a lower support pattern on lower lateral surfaces of the plurality of bottom electrodes. The lower support pattern is disposed between the substrate and the upper support pattern, and a first bottom electrode of the plurality of bottom electrodes includes a first recess adjacent to a bottom surface of the lower support pattern.

Memory cell capacitor with varying width and supportive structures

A semiconductor chip package test socket may include a socket housing; a plurality of probe needles in the socket housing; a conductive pad on the probe needles; a floating guide configured to cover an edge of the conductive pad and configured to provide a semiconductor chip package on the conductive pad; and/or clamps fixed at the socket housing. The clamps may combine the floating guide with the socket housing.

Test socket having a housing with clamping devices to connect the housing to a floating guide

Growing community of inventors

Seoul, South Korea

Suklae Kim