Samsung Electronics Co., Ltd.

Suk-Soo Pyo

Hyun-Taek Jung

Hyuntaek Jung

Tae-Joong Song

Taejoong Song

Gwan-Hyeob Koh

Artur Antonyan

Boyoung Seo

Dae-Shik Kim

Hyun Taek Jung

Taehyun Kim

Uk-Song Kang

Sang-won Shim

Eunji Lee

Chankyung Kim

Yong-kyu Lee

Bo-young Seo

Gyuseong Kang

Min-yeol Ha

Jung Kyu Jang

So-hee Hwang

A power switch circuit and non-volatile memory device including the same are provided. The power switch circuit includes a multi-voltage providing circuit configured to receive a first voltage and a second voltage greater than the first voltage, output a third voltage corresponding to the first voltage to a first output terminal, and output a fourth voltage corresponding to the second voltage to a second output terminal. The power switch circuit also includes a leakage current prevention circuit configured to cut off a leakage current flowing through the multi-voltage providing circuit. The multi-voltage providing circuit includes a first inverter which is driven using the second voltage. The leakage current prevention circuit is configured to cut off the leakage current flowing through the first inverter in response to both the first voltage and the second voltage being provided to the multi-voltage providing circuit.

Power switch circuit and non-volatile memory device comprising the same

A memory device which includes a control logic circuit that generates a write enable signal based on a write command, a first memory cell connected with a first word line and a first column line, a first write circuit that receives first write data to be stored in the first memory cell through a first write input/output line and applies a write voltage to a first data line based on the first write data in response to the write enable signal, and a first column multiplexer circuit that selects the first column line and connects the first column line with the first data line in response to a first column select signal, such that the write voltage is applied to the first memory cell. The first write circuit applies the write voltage to a bulk port of the first column multiplexer circuit in response to the write enable signal.

Memory devices and operation methods thereof including a write voltage selectively applied to a well of a column multiplexer circuit

A nonvolatile memory device including a memory cell array including a plurality of nonvolatile memory cells and a row decoder connected with the memory cell array through wordlines may be provided. The row decoder may be configured to precharge a first wordline corresponding to a first row address from among the wordlines, in response to receiving the first row address together with a first command, and maintain a precharge state of the first wordline, in response to receiving a second row address being identical to the first row address together with a second command following the first command.

Nonvolatile memory device, operating method of nonvolatile memory device, and electronic device including nonvolatile memory device

A nonvolatile memory device includes a memory cell comprising a first variable resistor having one end connected to a first node, and the other end connected to a second node through a cell transistor; and a reference cell comprising a second variable resistor having one end connected to a third node, and the other end connected to a fourth node through a reference cell transistor, wherein gates of the cell transistor and the reference cell transistor are connected to a word line. Directions of a first read current flowing in the memory cell and a direction of a second read current flowing in the reference cell are opposite to each other.

Resistive memory device having read currents for a memory cell and a reference cell in opposite directions

An operating method of a storage device which includes a first nonvolatile memory device and a second nonvolatile memory device includes detecting sudden power-off, suspending an operation being performed in the first nonvolatile memory device, in response to the detected sudden power-off, writing suspension information about the suspended operation into the second nonvolatile memory device, and performing a block management operation on the first nonvolatile memory device based on the suspension information written into the second nonvolatile memory device, in power-up after the sudden power-off.

Storage device and operating method thereof

A memory device including a normal memory cell array including a first magneto-resistance memory cell that is connected to a first bit line, a first source line, and a first word line, and configured to receive a selection voltage through the first word line, a monitor memory cell array including a second magneto-resistance memory cell that is connected to a first signal line and a second signal line, a gate of a cell transistor of which is configured to receive a non-selection voltage, and a body bias generator configured to sense a leakage current flowing through the first signal line and control a body voltage provided to each of a body of a cell transistor of the first magneto-resistance memory cell and a body of the cell transistor of the second magneto-resistance memory cell based on the leakage current may be provided.

Memory device for reducing leakage current

A device for supporting a test mode for memory testing according to an example embodiment of the inventive concepts may include a memory configured to receive and store writing data and output reading data from the stored writing data; an error correction code (ECC) engine configured to generate the writing data by encoding input data and to generate output data by correcting error bits of N bits or less included in receiving data when N is a positive integer; and an error insertion circuit configured to provide the reading data to the ECC engine as the receiving data in a normal mode and to provide data obtained by inverting at least one bit of less than N bits of the reading data to the ECC engine as the receiving data in the test mode.

Device for supporting error correction code and test method thereof

A method of controlling a reference cell in a resistive memory to identify values stored in a plurality of memory cells is provided. The method includes writing a first value to the plurality of memory cells, providing, to the reference cell, monotonically increasing or monotonically decreasing reference currents. The method includes reading the plurality of memory cells as each of the reference currents is provided to the reference cell, and determining a read reference current based on an aggregation of results of the reading.

Resistive memory device including a reference cell and method of controlling a reference cell to identify values stored in memory cells

A resistive memory device includes: a voltage generator generating a write word line voltage according to activation of a write enable signal; a switch circuit outputting one of the write word line voltage and a read word line voltage in response to the write enable signal as an output voltage; a word line power path connected to the switch circuit to receive the output voltage; and a word line driver driving a word line according to a voltage applied to the word line power path, wherein a write command starts to be received after a certain delay following the activation of the write enable signal, and a write operation is performed within an activation period of the write enable signal in response to the received write command.

Resistive memory device having reduced chip size and operation method thereof

A nonvolatile memory device includes a first variable resistance element connected to a first bit line, and a first transmission ;ate connected between the first variable resistance element and a first source line. The first transmission gate includes a first insulating layer formed on a well connected to aground voltage, a first n-channel metal oxide semiconductor (NMOS) transistor formed on the first insulating layer and connected to a first word line, a second insulating layer formed on the well, the second insulating layer being in the same layer as the first insulating layer, and a first p-channel metal oxide semiconductor (PMOS) transistor formed on the second insulating layer and connected to a first write word line.

Nonvolatile memory device and operating method thereof

Provided is a resistive memory device configured to output a value stored in a memory cell in response to a read command, the resistive memory device including a cell array including the memory cell and a reference cell; a reference resistance circuit configured to be electrically connected to the reference cell; an offset current source circuit configured to add or draw an offset current to or from a read current provided to the reference resistance circuit; and a control circuit configured to control the offset current source circuit to compensate for a variation of a resistance of the memory cell.

Resistive memory device including reference cell and operating method thereof

A memory device includes a delay locked loop that generates a first code for delaying a reference clock in a first operation mode that is a normal operation mode, generates a second code for delaying the reference clock in a second operation mode that is a refresh mode, and delays the reference clock in response to one of the first and second codes depending on one of the first and second operation modes, and a data output circuit that outputs a data strobe signal (DQS) using the delayed reference clock.

Nonvolatile memory device and operating method of nonvolatile memory device

A memory device includes at least one reference cell and multiple memory cells. A method of operating the memory device may include detecting a temperature of the memory device and controlling a level of a first read signal applied to the at least one reference cell in accordance with a result of the detecting of the temperature. The method may also include comparing a first sensing value sensed by applying the first read signal to the at least one reference cell with a second sensing value sensed by applying a second read signal to a selected memory cell among the multiple memory cells.

Memory device with temperature-dependent reading of a reference cell

An operating method of a nonvolatile memory device includes storing different data in first and second reference cells connected to a word line, checking whether the different data are abnormally stored in the first and second reference cells, and when it is determined that the different data are abnormally stored in the first and second reference cells, swapping the first and second reference cells.

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Hwaseong-si, South Korea

Suk-Soo Pyo