Samsung Display Co., Ltd.

Suk-Ho Lee

Hirotsugu Kishimoto

Alexander Voronov

Gyoo-Wan Han

Kyung-Hoe Heo

Dong-youb Lee

Hojin Kang

Kyung-Mok Lee

Jae-Seung Yoo

Minsung Kwon

Jung-Hun Lee

Sungjune Park

ByeongKyu Park

A display device includes a folding area at which the display device is foldable; a first non-folding area and a second non-folding area opposing each other with the folding area therebetween; a display panel; an adhesive member having a thickness of about 15 micrometers to about 18 micrometers; and a protective film facing the display panel with the adhesive member having the thickness of about 15 micrometers to about 18 micrometers therebetween, the adhesive member coupling the protective film to the display panel.

Display device having adhesive member at folding area

A display device includes a display panel including a first non-folding area, a second non-folding area, and a folding area disposed between the first non-folding area and the second non-folding area and foldable with respect to a folding axis, an adhesive layer disposed under the display panel, and a support layer disposed under the adhesive layer, the support layer including a first supporter overlapping the first non-folding area and the second non-folding area, and a second supporter overlapping the folding area. The first supporter and the second supporter include different materials from each other.

Display device

A method for inspecting a polysilicon layer includes: radiating excitation light to the polysilicon layer; and detecting a photoluminescence signal generated by the excitation light, wherein average power of the excitation light has a range of 1 W/cmto 10 W/cm, and peak power of the excitation light has a range of 100 W/cmto 1000 W/cm.

Method for inspecting polysilicon layer

A device for inspecting a polycrystalline silicon layer that is crystallized by receiving irradiated laser beams on a front side of the polycrystalline silicon layer includes: a light source configured to emit inspection beams to a rear side of the polycrystalline silicon layer; a light inspector configured to inspect the inspection beams reflected at the rear side of the polycrystalline silicon layer; and a controller that controls the light source and the light inspector.

Device and method for inspecting polycrystalline silicon layer

Growing community of inventors

Yongin, South Korea

Suk-Ho Lee