Nvidia Corporation

Suhas Mysore Satheesh

Tezaswi Raja

Nishit Harshad Shah

Gunaseelan Ponnuvel

Ting Ku

Krishnamraju Kurra

Varghese George

Rubil Ahmadi

In various embodiments, a comparison circuit compares voltages within an integrated circuit. The comparison circuit includes a comparison capacitor, an inverter, and multiple switches. A first terminal of the comparison capacitor is coupled to both a first terminal of a first switch and a first terminal of a second switch. A second terminal of the comparison capacitor is coupled to both a first terminal of a third switch and an input of the inverter. An output of the inverter is coupled to both a second terminal of the third switch and a first terminal of a fourth switch. A second terminal of the fourth switch is coupled to a first terminal of a fifth switch and a first output of the comparison circuit. At least a portion of the switches are turned on during a comparison model and are turned off during a reset mode.

On-die techniques for asynchnorously comparing voltages

In various embodiments, a current measurement circuit measures an input current within an integrated circuit. The current measurement circuit includes an integration capacitor, an operational amplifier, a comparison capacitor, an inverter, and multiple switches. The current measurement circuit is coupled to a clocking circuit that, during operation, generates a two-phase clock having a frequency that is proportional to the input current. At least a portion of the switches are turned on during a first phase of the two-phase clock and are turned off during a second phase of the two-phase clock.

On-die techniques for converting currents to frequencies

A system and method are provided for measuring an integrated circuit age. A first clock generator is provided for generating a first clock signal and a second clock generator is provided for generating a second clock signal. Further, a phase detector in communication with the first clock generator and the second clock generator is provided for receiving the first clock signal from the first clock generator and the second clock signal from the second clock generator, and outputting a phase difference signal that is capable of being used as a measure of an integrated circuit age. Still yet, a circuit in communication with the phase detector and the first clock generator is provided for receiving the first clock signal from the first clock generator and the phase difference signal from the phase detector and for synchronizing the phase difference signal from the phase detector with the first clock signal from the first clock generator.

System and method for measuring an integrated circuit age

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Sunnyvale, CA, United States of America

Suhas Mysore Satheesh