Infosys Limited

Sudripto De

Satyabrata Pradhan

Ashish Sureka

Srinivas Narasimhamurthy

A system, method and computer program product for the root cause analysis of the failure of a manufactured product is disclosed. The present invention includes the development of a knowledge model, based on information obtained from historical warranty claim forms and various manufacturing data sources. The invention also includes processing text information in a free-form text that is obtained from warranty claim forms by using text-tagging and annotation techniques. Thereafter, the knowledge model is converted to a Bayesian network. The present invention provides a user interface to select parameters and corresponding instances from current warranty claim forms. The selected parameters and corresponding instances are used as input evidence for the Bayesian network. The present invention facilitates the process of drawing inferences for root cause analysis of the failure of manufactured products and corresponding probabilities.

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Munirka, India

Sudripto De