Advanced Micro Devices Corporation

Sudhir S Kudva

Joel Thornton Irby

Srinivasan Srinath

A data processing device includes a first memory for use during normal operation of the device and a second memory for use during testing. The second memory stores a set of test patterns for testing of a functional module. When the data processing device is in a normal (i.e. non-test) mode of operation, data is retrieved from a first memory based on a received memory address. The retrieved data is applied to the functional module of the data processing device to perform a designated function. When the data processing device is in a test mode of operation, received memory addresses are provided to the second memory for retrieval of a test pattern associated with the address. The test pattern is applied to the functional module to generate an output pattern. The result of a test is determined by comparing the output pattern to an expected pattern.

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Minneapolis, MN, United States of America

Sudhir S Kudva