General Electric Company

Sudeep Mandal

Susanne Madeline Lee

Ansas Matthias Kasten

John Scott Price

Chengbao Wang

William Robert Ross

Juan Pablo Cilia

William Albert Challener

Slawomir Rubinsztajn

Brian David Yanoff

Renato Guida

Brian Magann Rush

Jason Harris Karp

Mahadevan Balasubramaniam

Loucas Tsakalakos

David Sirda Shanks

Sachin Narahari Dekate

Boon Kwee Lee

Stanislav Ivanovich Soloviev

Majid Nayeri

Faisal Razi Ahmad

Raj Bahadur

A microscope is provided. The microscope includes an illumination source configured to provide illumination beams to image a portion of a biological sample. The microscope also includes an optical unit configured to enable both phase contrast imaging and multicolor fluorescence imaging of the portion of the biological sample utilizing parallel point scanning. The microscope further includes a detector configured to simultaneously acquire multiple point images at different locations of the portion of the biological sample.

Miniaturized microscope for phase contrast and multicolor fluorescence imaging

An apparatus for inspecting integrity of a multi-barrier wellbore is described. The apparatus includes at least one source to generate radiation to impinge a target volume of the wellbore. The apparatus includes a source collimator having a plurality of alternating blocking channels and passing channels to direct radiation to impinge the target volume, such that the radiation directed from each passing channel forms a plurality of field of views extending radially into the target volume. The apparatus further includes at least one detector to receive backscatter rays arising from each respective field of view from the plurality of field of views and to generate an image representative of an inspected portion of the wellbore. The apparatus is useful for inspecting very small volumes in the multiple barriers of the wellbore and determine the integrity of the wellbore based on the different densities in the image of the inspected portion.

Apparatus and method for inspecting integrity of a multi-barrier wellbore

A detector assembly includes scintillators configured to generate a light signal in response to an impinging backscatter signal, where the scintillators are arranged in a first pattern, a plurality of first detectors, where each first detector is coupled to a scintillator and configured to receive a first portion of a light signal from that scintillator, and where the first detectors are arranged in a second pattern aligned with the first pattern, a plurality of second detectors, where each second detector is disposed adjacent a scintillator and configured to receive a second portion of the light signal from that scintillator, and where the plurality of second detectors is arranged in a third pattern, and a scintillator collimator including a plurality of openings and configured to selectively receive the backscatter signal, where the detector assembly is configured to provide depth resolution, azimuthal resolution, a defect type, a defect size, or combinations thereof.

System and method for monitoring integrity of a wellbore

A fluid sensor cable assembly and method uses one or more conductive bodies extending along an elongated core body for conducting a heating current to heat the cable assembly. The one or more conductive bodies also are configured to conduct an interrogation signal and to conduct reflections of the interrogation signal. One or more optical fibers extend along the length of the core body and include temperature sensitive elements at different locations along the length of the core body. The temperature sensitive elements measure heat flux out of the cable assembly at the different locations subsequent to heating the cable assembly and communicate the heat flux to a computer acquisition system.

Fluid sensor cable assembly, system, and method

A measurement system includes a cable having a length, a light source, at least one detector, and at least one processor. The light source is operably coupled to the cable and is configured to transmit an optical signal to the cable. The at least one processor is operably coupled to the cable and configured to: receive a scattered signal from the cable responsive to the optical signal transmitted to the cable; map the scattered signal to the length of the cable; and de-convolve a spatial averaging effect of the scattered signal using a weighting profile corresponding to the light source and the cable to generate a distributed property profile defined along the length of the cable.

Systems and methods for distributed measurement

Embodiments of the disclosure relate to X-ray imaging systems. In one embodiment, the X-ray imaging system features a target configured to receive a focused electron beam from an electron emitter and emit a line source X-ray beam as a result of receiving the focused electron beam; and a monochromator crystal configured to receive the line source X-ray beam from the target and diffract only a portion of the X-rays, wherein the portion of X-rays satisfies the Bragg diffraction condition for the monochromator crystal, and wherein the monochromator crystal is oriented relative to the target such that the portion of the X-rays from the target that satisfy the Bragg condition illuminate an entire length of a surface of the monochromator crystal.

Laboratory diffraction-based phase contrast imaging technique

In one embodiment, an X-ray source is provided that includes one or more electron emitters configured to emit one or more electron beams and one or more source targets configured to receive the one or more electron beams emitted by the one or more electron emitters and, as a result of receiving the one or more electron beams, to emit X-rays. Each source target of the X-ray source includes a first layer having one or more first materials; and a second layer in thermal communication with the first layer and having one or more second materials. The first layer is positioned closer to the one or more emitters than the second layer, the first material has a higher overall thermal conductivity than the second layer, and the second layer produces the majority of the X-rays emitted by the source target.

Multilayer X-ray source target with high thermal conductivity

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Niskayuna, NY, United States of America

Sudeep Mandal