Samsung Electronics Co., Ltd.

Subramanya Mayya Kolake

In-Seok Yeo

Sun-Woo Lee

Kyong-hee Joo

Xiao Feng Wang

Provided are a nano filament structure and a method of forming the nano filament structure. The nano filament structure includes a first layer disposed on a substrate, a second layer having a gap of nanometer size disposed on the first layer, a catalyst layer interposed between the first layer and the second layer, and a nano filament. One end of the nano filament is in contact with the catalyst layer and grows by penetrating the gap of the second layer.

Nano filament structure and methods of forming the same

A memory device includes an insulating layer formed over a substrate, a gate formed over the insulating layer, and charge storage elements disposed over the insulating layer. The charge storage elements are separated from each other and are electrically insulated, and each of the charge storage elements is capable of storing at least one charge. The charge storage elements can include fullerenes.

Semiconductor device and method for forming the same

A semiconductor device includes a substrate, an insulating layer having an opening, the opening exposing a portion of the substrate, a hydrophobic layer covering substantially only a sidewall and a top surface of the insulating layer, and a nanoscale conductive structure on the exposed portion of the substrate.

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Gyeonggi-do, South Korea

Subramanya Mayya Kolake