Nptest, Inc.

Aerometrics, Inc.

Subramanian V Sankar

William D Bachalo

Li Wang

Sergey Etchin

Timothy Michael Montagne

Andrew S Inenaga

A scintillator assembly used in a FIB (Focused Ion Beam) system to detect secondary electrons achieves nearly 100 percent collection efficiency for the majority of useful secondary electron energy ranges. Further, the insulator in the assembly is placed such that it is completely out of the secondary electron path in order to avoid arcing which affects FIB secondary electron imaging. Also, the gap between the grounding cap and the scintillator allows high collection efficiency offered by earlier designs to be retained, and at the same time, improves the system reliability. Further, the scintillator assembly may be placed closer to the primary ion beam, which further improves collection efficiency.

Compact, high collection efficiency scintillator for secondary electron detection

A direct backscatter technique provides for the detection of precipitation in a measuring volume. A source light beam is projected into the measuring volume. Light in the volume, including source light scattered from any precipitation within the volume, is collected and detected. A signal is generated corresponding to the detected light. This signal is used to determine whether precipitation is present in the measuring volume. The light scattered from precipitation within the measuring volume may also be used to differentiate between types of particles. Rain and snow, for example, can be differentiated based on whether the transmitted light changed from its original polarization state.

Method and apparatus for precipitation detection and differentiation

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Fremont, CA, United States of America

Subramanian V Sankar