Fujitsu Corporation

Subramanian K Iyer

Jawahar Jain

Debashis Sahoo

Amit Narayan

Christian Stangier

Mukul Ranjan Prasad

Thomas W Sidle

Yoshihisa Kojima

Takaya Ogawa

In one embodiment, a method includes simulating by one or more computer systems a larger circuit to assign one or more values to one or more latch variables associated with the larger circuit, generating by the one or more computer systems one or more reduced circuits from the larger circuit according to the values assigned to the latch variables, generating by the one or more computer systems a transition relation (TR) for each reduced circuit, and generating by the one or more computer systems an initial state set for one or more instances of validation on the reduced circuits according to the TRs.

Validating one or more circuits using one or more grids

A method for evaluating an erroneous state associated with a target circuit is provided that includes receiving information associated with a target circuit, the information identifying a property within the target circuit to be verified. One or more partitioned ordered binary decision diagram (POBDD) operations are executed using the information in order to identify an erroneous state associated with a sub-space within the target circuit. A path associated with the erroneous state is identified. The path reflects a correlation between an initial state associated with the erroneous state and a point where the erroneous state was encountered.

System and method for evaluating an erroneous state associated with a target circuit

In one embodiment, a method for verifying one or more particular properties of a circuit using a learning strategy to determine suitable values of particular verification parameters includes classifying each of multiple properties of a circuit according to circuit size and selecting a candidate property from the properties. The candidate property set includes one or more particular properties from each property class. The method also includes attempting to verify one or more particular properties of the circuit using the candidate property set and particular values of particular verification parameters. The method also includes determining suitable values of the particular verification parameters according the attempted verification of the particular properties of the circuit using the candidate property set and the particular values of the particular verification parameters.

Circuit verification

In one embodiment, a method for validating one or more circuits using one or more grids includes accessing a circuit and generating one or more seeds for executing one or more instances of validation on the circuit. Each instance of validation comprising one or more tasks. The method also includes distributing the tasks and the seeds across a grid including multiple nodes and, using the seeds, executing the instances of validation at the nodes in the grid according to the tasks.

Validating one or more circuits using one of more grids

In one embodiment, a method for determining one or more reachable states in a circuit using distributed computing and one or more partitioned data structures includes, at a first one of multiple computing systems, receiving a first partition of a circuit. The first partition corresponds to a first binary decision diagram (BDD) having a first density. The method includes performing a first reachability analysis on the first partition using the first BDD until a fixed point in the first partition has been reached and, if, during the first reachability analysis, the size of the first BDD exceeds a threshold, discarding the first BDD. The method includes communicating with at least one second one of the multiple computing systems. The second one of the multiple computing systems has received a second partition of the circuit. The second one of the multiple computing systems has performed a second reachability analysis on the second BDD without discarding the second BDD.

Determining one or more reachable states in a circuit using distributed computing and one or more partitioned data structures

A method for verifying a property associated with a target circuit is provided that includes receiving information associated with a target circuit, the information identifying a property within the target circuit to be verified. One or more operations may be executed in order to generate a set of transition relations for performing a reachability analysis associated with the target circuit. An image associated with the target circuit may be partitioned into a plurality of leaves that may each represent a subset of a final image to be generated by a partitioned ordered binary decision diagram (POBDD) data structure. An analysis may be computed of one or more of the leaves using a selected one or both of conjunction and quantification operations separately.

System and method for executing image computation associated with a target circuit

In one embodiment, a system for verifying a circuit using a scheduling technique includes one or more partitioned ordered binary decision diagram (POBDD) modules that collectively generate one or more POBDDs. Each POBDD corresponds to one or more partitions of a state space of the circuit and includes a number of states and a number of nodes in the partition. The system also includes one or more cost metrics modules that collectively determine a processing cost of each of the partitions of each of the POBDDs. The system also includes one or more scheduling modules that collectively schedule processing of the partitions of the POBDDs for semiformal verification of a circuit. The schedule is based, at least in part, on the determined processing costs of the partitions of the POBDDs.

A method for verifying a property associated with a target circuit is provided that includes receiving information associated with a target circuit, the information identifying a property within the target circuit to be verified. One or more partitioned ordered binary decision diagram (POBDD) operations are then executed using the information in order to generate a first set of states at a first depth associated with a sub-space within the target circuit. Bounded model checking may be executed using the first set of states in order to generate a second set of states at a second depth associated with the sub-space within the target circuit. The first set of states may be used as a basis for the second set of states such that the second depth is greater than the first depth.

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Austin, TX, United States of America

Subramanian K Iyer