Growing community of inventors

San Jose, CA, United States of America

Subodh M Reddy

Average Co-Inventor Count = 2.11

ph-index = 5

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 61

Subodh M ReddyRajeev Murgai (5 patents)Subodh M ReddyWilliam Warren Walker (4 patents)Subodh M ReddyKanji Uchino (2 patents)Subodh M ReddyTakeshi Horie (1 patent)Subodh M ReddyTakashi Miyoshi (1 patent)Subodh M ReddyToshiyuki Shibuya (1 patent)Subodh M ReddyGustavo R Wilke (1 patent)Subodh M ReddyRanjeez Murgai (1 patent)Subodh M ReddyMehdi B Tahoori (1 patent)Subodh M ReddySubodh M Reddy (12 patents)Rajeev MurgaiRajeev Murgai (10 patents)William Warren WalkerWilliam Warren Walker (39 patents)Kanji UchinoKanji Uchino (48 patents)Takeshi HorieTakeshi Horie (34 patents)Takashi MiyoshiTakashi Miyoshi (26 patents)Toshiyuki ShibuyaToshiyuki Shibuya (23 patents)Gustavo R WilkeGustavo R Wilke (1 patent)Ranjeez MurgaiRanjeez Murgai (1 patent)Mehdi B TahooriMehdi B Tahoori (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Fujitsu Corporation (12 from 39,244 patents)


12 patents:

1. 9646508 - Dynamic evolving virtual classroom

2. 9507875 - Symbolic hyper-graph database

3. 9280628 - System and method for clock network meta-synthesis

4. 9147002 - System and method for content storage and retrieval

5. 8799841 - Designing analog circuits

6. 8527257 - Transition-based macro-models for analog simulation

7. 8255196 - Constructing a replica-based clock tree

8. 7801718 - Analyzing timing uncertainty in mesh-based architectures

9. 7802215 - System and method for providing an improved sliding window scheme for clock mesh analysis

10. 7788613 - Border-enhanced sliding window scheme (SWS) for determining clock timing in a mesh-based clock architecture

11. 7313771 - Computing current in a digital circuit based on an accurate current model for library cells

12. 7246335 - Analyzing substrate noise

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