Xerox Corporation

Subarna Ghosh

Zhigang Fan

Hengzhou Ding

A method of estimating one or more dimensions of a patch panel may include receiving an image of a patch panel that comprises a plurality of ports and one or more gaps, extracting, by a computing device, a region of interest from the received image, detecting, by the computing device, one or more line segments from the region of interest, determining whether one or more candidate ports can be identified based on at least a portion of the line segments, and in response to determining that one or more candidate ports can be identified, identifying one or more candidate ports, and determining, by the computing device, a gap length associated with the identified candidate ports.

Methods and systems for detecting patch panel ports from an image in which some ports are obscured

A method of estimating one or more dimensions of a patch panel may include receiving an image of a patch panel that comprises a plurality of ports and one or more gaps, extracting, by a computing device, a region of interest from the received image, detecting, by the computing device, one or more possible port edges from the region of interest, fitting the detected possible port edges to a cross-ratio constancy model to determine a port-to-gap-length ratio associated with the patch panel, using the port-length-to-gap-length ratio to determine a location of one or more final port edges, and determining a location of one or more final ports based on the location of the final port edges.

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Williamsville, NY, United States of America

Subarna Ghosh