Korea Research Institute of Standards and Science

Su Yong Kwon

Sang Wook Lee

Yong-Gyoo Kim

Byung Il Choi

Jong Cheol Kim

Sang Bong Woo

Sungjun Lee

Jong Chul Kim

Youngseok Lee

Sunghun Kim

The present disclosure relates to a thermocouple wafer calibration system including: a main body portion composed of a chamber forming a sealed space, and a support installed a lower edge of the chamber and supporting the chamber to be spaced apart from the ground; a thermocouple wafer composed of a plate installed to be horizontal inside the sealed space of the chamber, and a first thermocouple unit attached to a upper surface of the plate so as to form a plurality of first measurement contact points; a calibration portion provided with a second thermocouple unit penetrating the chamber in a space where the chamber spaced from the ground, then partially accommodated inside the sealed space, and calibrated to form a plurality of second measurement contact points in contact with a lower surface of the plate at a position corresponding to each of the first measurement contact points; a temperature measurement portion partially accommodated inside the sealed space of the chamber and measuring a temperature of the sealed space; a heating portion accommodated inside the sealed space of the chamber, allowing thermogenesis and being in thermal contact with the second thermocouple unit directly; a measurement portion connected to the first and second thermocouple units respectively, and measuring each thermal electromotive force for the first and second measurement contact points occurring when the first and second thermocouple units are in contact indirectly at both sides on the basis of the plate; and a temperature control portion calculating each temperature value for the first and second measurement contact points depending on values measured from the measurement portion, and, after comparing and analyzing the calculated temperature values and temperature values measured from the temperature measurement portion, allowing adjusting the temperature of the sealed space by controlling the heating portion based on the analysis result.

Thermocouple wafer calibration system and calibration method using the same

The present disclosure relates to an apparatus embodied in order to correct efficiently changing of measured temperature value in a temperature sensor according to influence of irradiance. A radiosonde related an exemplary embodiment of the present disclosure includes a first temperature sensor; a second temperature sensor having higher emission ratio than the first temperature sensor; and a measuring unit in order to calculate corrected temperature value, but the radiosonde and the third temperature sensor are installed in a chamber before flying of the radiosonde, a first temperature change detected by the first temperature sensor by output light in a sunlight simulator and a second temperature change detected by the second temperature sensor are induces, compensation factors may be derived using the first temperature change, the second temperature change, and temperature value measured by the third temperature sensor.

Radiosonde air temperature measurement correction system and method

The present invention relates to a measurement method of dew-point in low temperature, and more specifically to a measurement method of accurately distinguishing dew-point and frost-point using a quartz crystal microbalance dew-point sensor in a low temperature of 0&#xb0; C. or less. To this end, the present invention provides a measurement method of distinguishing dew and frost point using a quartz crystal microbalance dew-point sensor in low temperature, comprising the steps of: measuring a resonant frequency of a quartz crystal microbalance dew-point sensor while slowly dropping temperature; observing shock waves of the resonant frequency; and determining dew point or frost point through the observation of the resonant frequency and shock waves of the quartz crystal microbalance dew-point sensor.

Measurement method of distinguishing dew and frost point using quartz crystal microbalance dew-point sensor in low temperature

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Daejeon, South Korea

Su Yong Kwon