The University of North Carolina at Charlotte

Insitutec, Inc.

Other

Albany Instruments, Inc.

Stuart T Smith

Shane C Woody

Marcin B Bauza

Robert J Hocken

Teodor Dogaru

Stephen C Howard

Jimmie Andrew Miller

Tsing-Hua Her

Pavan Jain

Jacob W Chesna

Richard M Seugling

Ashok Muralidhar

Paulo H Pereira

Jonathan D Ellis

Chi-Hua Hsu

Gurpreet Singh

In one aspect, kits for constructing an apparatus are described herein which, in some embodiments, can demonstrate desirable modularity, adjustability, and reconfigurability. A kit for constructing an apparatus described herein comprises a plurality of modular blocks and fastening pins and coupling pins for connecting the modular blocks to one another. A modular block comprises a first face having one or more first apertures for receiving fastening pins and an adjacent second face having one or more second apertures for receiving coupling pins. A fastening pin comprises a sidewall aperture for receiving a coupling pin.

Modular kit for construction of apparatus including positioning mechanisms

In one aspect, kits for constructing an apparatus are described herein which, in some embodiments, can demonstrate desirable modularity, adjustability, and reconfigurability. A kit for constructing an apparatus described herein comprises a plurality of modular blocks and fastening sleeves, sleeve pins and coupling pins for connecting the modular blocks to one another. A modular block comprises a series of first apertures for receiving one or more of the fastening sleeves and series of second apertures for receiving the sleeve pins to secure the fastening sleeves in the first apertures, wherein the second apertures intersect the first apertures.

In one aspect, methods of determining the shape of a sessile drop are described herein. In some embodiments, a method described herein comprises measuring a first shape parameter of a sessile drop to obtain a first shape parameter value, measuring a second shape parameter of the drop to obtain a second shape parameter value, and using the first and second shape parameter values to calculate a third shape parameter value of a third shape parameter of the drop.

Methods of determining the shape of a sessile drop

The present invention provides a multi-dimensional standing wave probe for microscale and nanoscale measurement, manipulation, and surface modification, including: a filament having a first free end and a second end that is attached to at least one actuator to apply oscillation cycles to the filament; wherein the oscillation of the filament during at least one complete cycle of oscillation of the actuator causes the free end to move in a multi-dimensional envelope, producing a defined virtual probe tip at the free end, wherein a shape of the virtual probe tip is defined by both a characteristic shape of the oscillation of the free end and a geometry of the filament. Optionally, the actuator includes a monolithic crystal actuator. Preferably, the monolithic crystal actuator includes a crystal having zero grain boundaries. The monolithic crystal actuator also includes a plurality of thin flexure structures. The monolithic crystal actuator further includes a plurality of metallic electrodes disposed on inside or outside surfaces, or a combination thereof, of the plurality of thin flexure structures.

Multi-dimensional standing wave probe for microscale and nanoscale measurement, manipulation, and surface modification

A symmetric ultra-precision spindle design in which all forces of constraint are, within the tolerances of manufacturing and assembly processes, symmetrically arranged about its axis. Additionally this design may require little or no external power other than the forces to rotate the spindle.

Symmetric spindle design

The present invention provides a self-sensing tweezer device for micro and nano-scale manipulation, assembly, and surface modification, including: one or more elongated beams disposed in a first configuration; one or more oscillators coupled to the one or more elongated beams, wherein the one or more oscillators are operable for selectively oscillating the one or more elongated beams to form one or more 'virtual' probe tips; and an actuator coupled to the one or more elongated beams, wherein the actuator is operable for selectively actuating the one or more elongated beams from the first configuration to a second configuration.

Self-sensing tweezer devices and associated methods for micro and nano-scale manipulation and assembly

An apparatus for profiling the surface of a workpiece, including a probe adapted to make contact with the surface of a workpiece, a sensor for determining or deriving the force between the probe and the workpiece surface, an actuator that adjusts the position of the probe along an axis, which is generally perpendicular to the surface of the workpiece, in order to maintain a constant force between the probe and the surface, and a closed control loop, including a controller that controls the operation of the actuator based on information from the sensor.

Method and apparatus using a closed loop controlled actuator for surface profilometry

The present invention provides an apparatus and method for performing surface property measurements, such as workpiece hardness and other material property measurements, with in-process compensation for instrument frame distortion and the like. The apparatus includes a substantially rigid base; a stylus coupled to the substantially rigid base, the stylus configured and selectively positioned to interact with a surface of a specimen at points along a central axis of the stylus; a proximity detector sensor coupled to the substantially rigid base, the proximity detector sensor disposed at a predetermined distance from the surface of the specimen and operable for sensing the predetermined distance between the proximity detector sensor and the surface of the specimen; and a proximity detector actuator coupled to the substantially rigid base, the proximity detector actuator operable for maintaining the predetermined distance between the proximity detector sensor and the surface of the specimen as the substantially rigid base and the stylus are moved with respect to the surface of the specimen along the central axis of the stylus.

Apparatus and method for surface property measurement with in-process compensation for instrument frame distortion

A small-scale positioning device employing a platform, a levering mechanism and a floating actuator device. The platform is movably attached to a fixed frame by a lever, a pair of levers, or more. The floating actuator device is coupled between at least one lever and the platform. When the actuator device is activated, it generates a force on the platform and an equal but opposite force on the levering mechanism, causing one or more levers to rotate around their respective fulcrums, thereby controlling the position of the movable platform relative to the fixed frame. The amount of displacement of the platform is dependent upon the effective expansion or contraction of the actuator device and the lever ratio. If the pair of levers are symmetrical, then motion is created in only a single degree of motion. Flexures may be included to prevent motion in unwanted directions.

Method of positioning a platform relative to a fixed frame and a small scale positioning device

An oscillating probe of an elongated rod, having a first free end, and a second end that is attached to at least one actuator to apply oscillation cycles to the rod. Oscillation of the elongated rod during at least one complete cycle of oscillation of the actuator causes the free end to move in at least one-dimensional envelope, producing a defined virtual probe tip geometry at the free end. The probe is connected to a system for utilizing information sensed as the free end is placed near a surface.

Oscillating probe with a virtual probe tip

Products are disclosed for measuring electromagnetic fields. One embodiment has at least two coplanar magneto-resistive sensors. Each magneto-resistive sensor has a sensitive axis in the plane of the at least two coplanar magneto-resistive sensors. The at least two magneto-resistive sensors may be orthogonally arranged about a central point to measure orthogonal components of electromagnetic fields.

Sensors and probes for mapping electromagnetic fields

A closed loop motion control system employing at least one relaxor actuator which controls the position of a moving member having mass by controlling an electric field applied to the relaxor actuator. The actuator comprises a body of relaxor material dimensionally variable under the influence of the electric field applied in the form of a voltage to electrodes on at least two surfaces of the actuator. The voltage is applied in response to a feedback signal produced by at least one feedback sensor, which may be a displacement sensor or some other type of sensor. Thus, by constantly monitoring the displacement or other variable of the actuator device, the position of the moving member may be precisely controlled.

Closed loop control systems employing relaxor ferroelectric actuators

A giant magnetoresistive (GMR) based eddy current sensor including a giant magnetoresistive sensor integrated on a silicon chip with a signal conditioning circuit and a circular coil.

Sensor for eddy current testing and method of use thereof

A force characterization device utilizes a flexure having a compliant portion and a solid portion. During operation of a coordinate measuring machine (CMM) on the solid portion of the flexure, a first capacitance probe detects displacement of the solid portion of the flexure in a first dimension and a second capacitance probe detects displacement of the solid portion of the flexure in a second dimension perpendicular to the first dimension. The detected displacements in the first and second dimensions of the solid portion of the flexure are correlated to forces applied to the flexure in the first and second dimensions based on the detected displacements and the predetermined spring constant of the compliant portion of the flexure. A total applied force is determined based on the forces applied to the flexure in the first and second dimensions. The flexure may be utilized for touch-trigger operations or scanning operations of the CMM. For scanning operations, a normal force applied and a coefficient of friction between the contact probe of the CMM and the solid portion of the flexure may be determined from the total applied force and the forces applied in the first and second dimensions.

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Charlotte, NC, United States of America

Stuart T Smith