Caastle, Inc.

Steven Sesshu Shimozaki

Lindsey Winland

Jessica Guertin

Mahan Saalabi

A computer-implemented method includes receiving one or more articles at an inspection station that includes an inspection processor, inspecting the one or more articles in view of at least one repairability criterion presented via one or more graphical elements, and updating an inspection database if the one or more articles fails the at least one repairability criterion. The method includes inspecting the one or more articles in view of at least one local repair criterion presented via one or more graphical elements, inspecting the one or more articles in view of at least one inspector-driven criterion presented via one or more graphical elements, the action type including at least one of determining an inspection failure or a passed inspection, and updating inspection history data stored in an inspection database in communication with the inspection processor based on the at least one repairability criterion, local repair criterion, or inspector-driven criterion.

Systems and methods for phased article inspections

Disclosed are methods, systems, and non-transitory computer-readable medium for color and pattern analysis of images including wearable items. For example, a method may include receiving an image depicting a wearable item, identifying the wearable item within the image by identifying a face of an individual wearing the wearable item or segmenting a foreground silhouette of the wearable item from background image portions of the image, determining a portion of the wearable item identified within the image as being a patch portion representative of the wearable item depicted within the image, deriving one or more patterns of the wearable item based on image analysis of the determined patch portion of the image, deriving one or more colors of the wearable item based on image analysis of the determined patch portion of the image, and transmitting information regarding the derived one or more colors and information regarding the derived one or more patterns.

Growing community of inventors

Rocklin, CA, United States of America

Steven Sesshu Shimozaki