International Business Machines Corporation

Steven Paul Norgaard

Robert Edward Galbraith

Evangelos Stavros Eleftheriou

Roman Alexander Pletka

Charalampos Pozidis

Daniel Frank Moertl

Adrian Cuenin Gerhard

Ioannis Koltsidas

Robert Haas

Brian Eric Bakke

Damir Anthony Jamsek

Andrew Kenneth Martin

Xiao-yu Hu

Donald J Ziebarth

Murali N Iyer

Jeremy T Ekman

Jessica M Gisi

Timothy James Larson

Gerald Mark Grabowski

Abby Harrison

Dennis David Reetz

Timothy J Schimke

Keith Ronald Halphide

Timothy B Lund

A memory system and method for storing data in one or more storage chips includes: one or more memory cards each having a plurality of storage chips, and each chip having a plurality of dies having a plurality of memory cells; a memory controller comprising a translation module, the translation module further comprising: a logical to virtual translation table (LVT) having a plurality of entries, each entry in the LVT configured to map a logical address to a virtual block address (VBA), where the VBA corresponds to a group of the memory cells on the one or more memory cards, wherein each entry in the LVT further includes a write wear level count to track the number of writing operations to the VBA, and a read wear level count to track the number of read operations for the VBA mapped to that LVT entry.

Logical to virtual and virtual to physical translation in storage class memory

A method for optimizing locations of physical data accessed by one or more client applications interacting with a storage system, with the storage system comprising at least two redundancy groups having physical memory spaces and data bands. Each of the data bands corresponds to physical data stored on several of the physical memory spaces. A virtualized logical address space includes client data addresses utilizable by the one or more client applications. A storage controller is configured to map the client data addresses onto the data bands, such that a mapping is obtained, wherein the one or more client applications can access physical data corresponding to the data bands.

Optimizing locations of data accessed by client applications interacting with a storage system

A method and apparatus for dynamic allocation of DMA buffers in the DRAM banks of an I/O adaptor. The method and apparatus determine the functional status of the adaptor, allocate critical, volatile DMA buffers in non-critical DRAM banks if the adaptor is fully functional, and allocate critical, volatile DMA buffers in critical DRAM banks if the adaptor is partially functional.

Dynamic allocation of DMA buffers in input/output adaptors

Embodiments are provided for testing termination circuits in SCSI bus controllers. In one embodiment, the termination circuits are tested by sending test data between respective SCSI controllers of the termination circuits for varying enabled/disabled statuses of the termination circuits.

Testing of termination circuits in SCSI bus controllers

In a first aspect, a computer system includes a storage adapter, a disk drive and a SCSI bus interconnecting the storage adapter and the disk drive. The storage adapter is connected to the SCSI bus via a first active termination circuit and the disk drive is connected to the SCSI bus via a second active termination circuit. The first active termination circuit is disabled and diagnostic signals are coupled to the bus. The frequency of errors in the diagnostic signals is detected to determine whether the second active termination circuit is in a failing condition.

Method and apparatus for detecting and isolating failures in equipment connected to a data bus

A computer program is provided. The computer program product includes a medium readable by a computer, the medium (1) having means for inputting a signal representative of a temperature range in which a temperature of an operating environment of a battery resides; and (2) means for estimating a service life of the battery based on the signal. Other means are also provided.

Method and apparatus for estimating the service life of a battery

An apparatus is provided for estimating the service life of a battery. The apparatus includes a temperature measurement circuit that measures a temperature of an operating environment of the battery and outputs a signal representative of the temperature of the operating environment. A controller coupled to the temperature measurement circuit receives the temperature signal therefrom and estimates the service life of the battery based on the temperature signal. Preferably, the temperature measurement circuit outputs a signal representative of a temperature range in which the measured operating environment temperature resides and the controller estimates the service life of the battery based on the temperature range signal output by the temperature measurement circuit. A method and a computer program product also are provided for similarly estimating the service life of a battery.

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Rochester, MN, United States of America

Steven Paul Norgaard