Growing community of inventors

Westminster, CO, United States of America

Steven Michael Kientz

Average Co-Inventor Count = 2.99

ph-index = 5

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 75

Steven Michael KientzMichael Sheperek (24 patents)Steven Michael KientzBruce A Liikanen (20 patents)Steven Michael KientzVamsi Pavan Rayaprolu (16 patents)Steven Michael KientzLarry Joseph Koudele (13 patents)Steven Michael KientzShane G Nowell (13 patents)Steven Michael KientzMustafa Nazmi Kaynak (12 patents)Steven Michael KientzKishore Kumar Muchherla (8 patents)Steven Michael KientzPeter Sean Feeley (5 patents)Steven Michael KientzPatrick Robert Khayat (5 patents)Steven Michael KientzSivagnanam Parthasarathy (4 patents)Steven Michael KientzChia-Yu Kuo (3 patents)Steven Michael KientzUgo Russo (2 patents)Steven Michael KientzPitamber Shukla (2 patents)Steven Michael KientzMatthew P Wojciechowski (2 patents)Steven Michael KientzRobert W Mason (2 patents)Steven Michael KientzJun Wan (1 patent)Steven Michael KientzRenato C Padilla (1 patent)Steven Michael KientzGary F Besinga (1 patent)Steven Michael KientzDung Viet Nguyen (1 patent)Steven Michael KientzSteven Gregory Trabert (1 patent)Steven Michael KientzMark Lee Watson (1 patent)Steven Michael KientzChristopher M Smitchger (1 patent)Steven Michael KientzHyungSeok Kim (1 patent)Steven Michael KientzDavid Lyle Peterson (1 patent)Steven Michael KientzMichael S Wagner (1 patent)Steven Michael KientzHyung Seok Kim (1 patent)Steven Michael KientzKevin D Mckinstry (1 patent)Steven Michael KientzSteven Michael Kientz (52 patents)Michael SheperekMichael Sheperek (104 patents)Bruce A LiikanenBruce A Liikanen (166 patents)Vamsi Pavan RayaproluVamsi Pavan Rayaprolu (170 patents)Larry Joseph KoudeleLarry Joseph Koudele (109 patents)Shane G NowellShane G Nowell (75 patents)Mustafa Nazmi KaynakMustafa Nazmi Kaynak (152 patents)Kishore Kumar MuchherlaKishore Kumar Muchherla (340 patents)Peter Sean FeeleyPeter Sean Feeley (200 patents)Patrick Robert KhayatPatrick Robert Khayat (125 patents)Sivagnanam ParthasarathySivagnanam Parthasarathy (225 patents)Chia-Yu KuoChia-Yu Kuo (3 patents)Ugo RussoUgo Russo (40 patents)Pitamber ShuklaPitamber Shukla (24 patents)Matthew P WojciechowskiMatthew P Wojciechowski (14 patents)Robert W MasonRobert W Mason (6 patents)Jun WanJun Wan (73 patents)Renato C PadillaRenato C Padilla (52 patents)Gary F BesingaGary F Besinga (43 patents)Dung Viet NguyenDung Viet Nguyen (35 patents)Steven Gregory TrabertSteven Gregory Trabert (30 patents)Mark Lee WatsonMark Lee Watson (15 patents)Christopher M SmitchgerChristopher M Smitchger (15 patents)HyungSeok KimHyungSeok Kim (7 patents)David Lyle PetersonDavid Lyle Peterson (5 patents)Michael S WagnerMichael S Wagner (2 patents)Hyung Seok KimHyung Seok Kim (1 patent)Kevin D MckinstryKevin D Mckinstry (1 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Micron Technology Incorporated (45 from 37,640 patents)

2. Oracle America, Inc. (3 from 1,927 patents)

3. Storage Technology Corporation (3 from 946 patents)

4. Sun Microsystems, Inc. (1 from 7,621 patents)


52 patents:

1. 12431205 - Adaptive calibration for threshold voltage offset bins

2. 12430206 - Temperature sensor management during error handling operations in a memory sub-system

3. 12424287 - Memory read voltage threshold tracking based on memory device-originated metrics characterizing voltage distributions

4. 12423013 - Open block family duration limited by temperature variation

5. 12353771 - Charge loss mitigation throughout memory device lifecycle by proactive window shift

6. 12322473 - Determining read voltage offset in memory devices

7. 12307111 - Block family-based error avoidance for memory devices

8. 12293099 - Open block family duration limited by time and temperature

9. 12266420 - Temperature-compensated time estimate for a block to reach a uniform charge loss state

10. 12223190 - Measurement of representative charge loss in a block to determine charge loss state

11. 12210759 - Threshold voltage bin calibration at memory device power up

12. 12131795 - Adaptive temperature compensation for a memory device

13. 12119068 - Program continuation strategies after memory device power loss

14. 12073866 - Two-stage voltage calibration upon power-up of memory device

15. 12057190 - Determining read voltage offset in memory devices

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