Cognex Corporation

Cognex Technology and Investment Corporation

Emhart Industries, Inc.

Emhart Inc.

Steven M Whitman

Brian V Mirtich

John F Keating

Andrew Eames

Brian Phillips

Robert J Tremblay, Ii

Robert Tremblay

Carroll McNeill Arbogast, Jr

Rodney P Jackson

Robert J Duncan

William H Mirley, Jr

James V Howard

Carroll McNeil Arbogast, Jr

Marc M Landman

Brian S Philips

William J Loconzolo

A graphical user interface (GUI) display and GUI-based system for displaying and controlling vision system operating parameters of a contour sensor comprises an automated region of interest graphic image applied to a discrete region of a selected image in response to a single click by a user at the discrete region of the selected image, the selected image selected from a window on the GUI display containing a plurality of captured images of the object. At least one automated operating parameter is generated automatically in response to the single click by the user at the discrete region of the selected image to determine whether a contour of interest is in the automated ROI graphic image. The GUI also provides a contour graphic image that outlines the contour of interest to demonstrate whether the contour of interest is in (present or at the correct position within) the automated ROI graphic image.

System, method and graphical user interface for displaying and controlling vision system operating parameters

This invention provides a Graphical User Interface (GUI) that operates in connection with a machine vision detector or other machine vision system, which provides a highly intuitive and industrial machine-like appearance and layout. The GUI includes a centralized image frame window surrounded by panes having buttons and specific interface components that the user employs in each step of a machine vision system set up and run procedure. One pane allows the user to view and manipulate a recorded filmstrip of image thumbnails taken in a sequence, and provides the filmstrip with specialized highlighting (colors or patterns) that indicate useful information about the underlying images. The programming of logic is performed using a programming window that includes a ladder logic arrangement.

Human-machine-interface and method for manipulating data in a machine vision system

This invention provides a system and method for employing GUI-based non-numeric slide buttons and bar meters to setup and monitor operating parameters of a vision system. Graphical representations of operating parameters are displayed in a parameter box on the GUI with moving bars that are shaded, patterned or colored so as to provide a relative level between two extremes on a scale of the given operating parameter. Input of operating parameter settings with respect to the scale is made by moving a setting slider along the scale between the extremes. The position of the slider establishes the user-input setting relative to the scale. In an illustrative embodiment, scales, level bars and setting sliders can also be displayed on the image view itself, adjacent to a given image view feature, which is the subject of the scale.

System and method for displaying and using non-numeric graphic elements to control and monitor a vision system

This invention provides a system and method for automating the setup of Locators and Detectors within an image view of an object on the HMI of a vision detector by determining detectable edges and best fitting the Locators and Detectors to a location on the object image view following the establishment of an user selected operating point on the image view, such as by clicking a GUI cursor. In this manner, the initial placement and sizing of the graphical elements for Locator and Detector ROIs are relatively optimized without excessive adjustment by the user. Locators can be selected for direction, including machine or line-movement direction, cross direction or angled direction transverse to cross direction and movement direction. Detectors can be selected based upon particular analysis tools, including brightness tools, contrast tools and trained templates. The Locators and detectors are each associated with a particular set of operating parameters, such as activation threshold, which are displayed in a control box within the GUI (and can be accessed by clicking on the specific Locator or Detector. A parameter bar can also be provided adjacent to the depiction of the Detector on the image view for easy reference. Both Locators and Detectors may be manually readjusted once automatically placed and sized by drag and drop techniques.

System and method for assigning analysis parameters to vision detector using a graphical interface

This invention provides a system and method for employing GUI-based non-numeric slide buttons and bar meters to setup and monitor operating parameters of a vision system (the term 'vision system' as used herein including the above-described vision detector). Such parameters can include, but are not limited to the threshold at which a feature is activated in viewing an image. Operating parameters also include the under-lying range of contrast values and levels of brightness intensities (or by input inversion, the level of darkness) recognized and acted upon by the vision system. Graphical representations of operating parameters are displayed in a parameter box on the GUI with moving bars that are shaded, patterned or colored so as to provide a relative level between two extremes on a scale of the given operating parameter. The endpoints of the scale can be established by analyzing the relevant extremes on a subject image view. The current level of the given parameter is displayed as a bar that extends a distance along the scale that is proportional to the current level of the parameter along the scale. Input of operating parameter settings with respect to the scale is made by moving a setting slider along the scale between the extremes. The position of the slider establishes the user-input setting relative to the scale. In an illustrative embodiment, scales, level bars and setting sliders can also be displayed on the image view itself, adjacent to a given image view feature, which is the subject of the scale.

A method of inspecting an image to locate a ball grid array surface-mounted device includes the steps of inspecting the image to find its surface features and to determine their locations (referred to herein as their &ldquo;observed&rdquo; locations); comparing expected locations of those features with the observed locations to identify missing surface features; reinspecting the image in the vicinity of apparently missing surface features to verify if the feature is really missing or to find those features and to determine their &ldquo;observed&rdquo; locations; and determining, from the observed locations of the surface features, the position and/or angle of the ball grid array surface-mounted device. The invention can be used to determine the position and/or angle of ball grid array surface-mounted devices with surface features in any of many array configurations, e.g., a regular lattice, a checker board lattice, a reverse checker board lattice, a regular lattice with a holes., and a custom lattice.

Machine vision methods and articles of manufacture for ball grid array

A method of inspecting an image to locate a ball grid array surface-mounted device includes the steps of inspecting the image to find its surface features and to determine their locations (referred to herein as their 'observed' locations); comparing expected locations of those features with the observed locations to identify missing surface features; reinspecting the image in the vicinity of apparently missing surface features to verify if the feature is really missing or to find those features and to determine their 'observed' locations; and determining, from the observed locations of the surface features, the position and/or angle of the ball grid array surface-mounted device. The invention can be used to determine the position and/or angle of ball grid array surface-mounted devices with surface features in any of many array configurations, e.g., a regular lattice, a checker board lattice, a reverse checker board lattice, a regular lattice with a holes, and a custom lattice.

The invention provides a method of testing a machine vision system of the type that inspects a feature (e.g., an electronic component) using object-oriented constructs that instantiate an inspection object from an inspection class that is associated with a type of the feature (e.g., the rectilinear component) and that invoke a method member of that object to inspect the feature to determine its characteristics (e.g., position, angular orientation, and shape conformance). The method of the invention includes the steps of instantiating a test object from a test class that corresponds to the inspection class, invoking a method member of that test object to generate one or more test images representing the feature, inspecting the test images to determine characteristics of the features therein, and reporting results of those inspections.

Method of testing a machine vision inspection system

The geometric features of a supported component in a machine for mounting surface mount electronic components are either frontlighted or backlighted for inspection purposes. To backlight the features a fluorescent surface above the component is excited with UV light. Since UV light reflected from the component is invisible to the camera system, the features will appear black with a bright background. To frontlight the features, a light source is used which generates light outside the UV range and a) having a wavelength corresponding to the wavelength of the UV fluorescing surface so that no fluorescent is created or b) having a wavelength substantially different from the UV fluorescing surface that is absorbed by the surface without causing fluorescing to take place. This light when reflected from the features is seen by the camera and the features will appear bright in a dark background.

Machine for placing surface mount components

Apparatus for performing a non-contact three-dimensional inspection of a surface-mount component prior to placement on a printed circuit board. Specifically, an arrangement to ensure acceptable alignment (i.e. coplanarity) of all component heads in the XZ or YZ plane, where XY is the plane of the component. The apparatus is embodied within a conventional pick and place machine and performs critical, in-process, lead coplanarity inspection.

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Danville, NH, United States of America

Steven M Whitman