At&t Bell Laboratories

Steven M Schulte

Peter Hartpence Read

Hugh Nicholl

Terry R McClure

Mohammad F Tabrizi

Garrett J Heyns

A system for cleaning test probes attached to a probe mat fixture by propelling CO.sub.2 pellets at the test probes, by rotating the fixture so that the pellets impact different sides of the test probes, and by providing electrostatic protection for active devices mounted on the probemat fixture. The CO.sub.2 pellets are propelled so that they strike the test probes at an angle to the horizontal plane of the test probe as mounted on the probemat fixture. Electrostatic protection is provided by connecting all electrical connections to the probemat fixture to ground and by reducing electrostatic charge build up on the probemat fixture by using an ionizer to direct ions at the probemat fixture.

Growing community of inventors

Westminster, CO, United States of America

Steven M Schulte