Cadence Design Systems, Inc.

International Business Machines Corporation

Other

Steven Lee Gregor

Puneet Kumar Arora

Norman Robert Card

R Dean Adams

Thomas J Eckenrode

Navneet Kaushik

Kamran K Zarrineh

Patrick Gallagher

Vivek Chickermane

Glenn David Gilda

Krishna Chakravadhanula

Mayan Moudgill

Garrett Stephen Koch

Thomas L Jeremiah

John Christopher Willis

Brion L Keller

Hehching Harry Li

Gary S Koch

Patrick W Gallagher

Patrick F Dutton

Robert A Iannucci

Mohit Madaan

Ankit Bandejia

Victor S Lee

Stephen M Reeve

Carl Alexander Wisnesky, Ii

Hanumantha Raya

David Robert Engebretsen

Ke Zhang

A memory view generator evaluates a module design file characterizing a memory module to generate a set of port functions that defines operations of ports on a memory module for a memory view file. The memory view generator parses a memory module bitmap characterizing a physical layout of the memory module to determine a physical memory model of address bits, an order of rows, an order of columns, an order of banks and data bits of the memory module for the physical memory view file. A circuit simulator instantiates a memory module and provide simulation results based on a simulation memory model of the memory module, the set of port functions and the physical memory model. The memory view generator analyzes the simulation results to determine operational performance characteristics of the memory module for the memory view file.

Memory view for memory module

A memory view generator evaluates a Liberty file characterizing an NVM module to generate a memory view file for the NVM module. The memory view file includes a port alias identifying ports of the NVM module. The port alias for a set of ports of the NVM module characterizes a type of port in the set of ports. The memory view file includes a port action identifying ports of the NVM module that have a static value and a port access identifying ports of the NVM module that have a dynamic value. The memory view file has an address limit characterizing a number of words in the NVM module and an address partition characterizing address bits and data bits. The memory view file includes a read delay that defines a number of clock cycles needed to hold an address bus stable after a strobe port transitions to an inactive state.

Memory view for non-volatile memory module

An NVM algorithm generator that evaluates a Liberty file characterizing an NVM module and a memory view of the NVM module that identifies ports and associated operations of the NVM module to generate a control algorithm. The control algorithm includes a read algorithm that includes an order of operations for assigning values to ports of the NVM module to assert a read condition of a strobe port, executing a memory read on the NVM module and setting values to the ports on the NVM module to assert a complement of a program condition. The control algorithm also includes a program algorithm that includes an order of operations for assigning values to ports of the NVM module to assert the program condition of the strobe port, executing a memory write and setting values to the ports on the NVM module to assert the complement of the program condition.

Control algorithm generator for non-volatile memory module

An exemplary system, method, and computer-accessible medium may be provided, which may include, for example, receiving a design a memory including a plurality MBIST logic paths and a plurality of non-MBIST logic paths, determining particular non-MBIST logic path(s) of the non-MBIST logic paths to deactivate, and deactivating only the particular non-MBIST logic path(s). The particular non-MBIST logic path(s) may be deactivated using a clock signal. A simulation on the memory may be performed while the particular non-MBIST logic path(s) may be deactivated. The particular non-MBIST logic path(s) may be reactivated after the simulation has been performed. The deactivating the particular non-MBIST logic path(s) may include forcing all flip flops in the particular non-MBIST logic path(s) to a known state.

Simulation event reduction and power control during MBIST through clock tree management

Systems and methods disclosed herein provide for efficiently testing memories during mission mode self-test ('MMST') without destroying any original functional data. Embodiments provide for a converter to feed a manipulated version of the original functional data back into the tested memories. Embodiments further provide an accumulator to count the occurrences of correctable and uncorrectable errors associated with the tested memories.

Testing for memories during mission mode self-test

Systems and methods disclosed herein provide for improved testing of memory error correction code ('ECC') logic with memory built-in self-test ('MBIST'). Embodiments provide for a masking element to inject one or more faults into the ECC logic during at least one of a manufacturing test ('MFGT') and a power-on-self-test (&#x201c;POST&#x201d;), wherein, based on the injected faults, it can be determined if the ECC logic contains any errors.

Testing for memory error correction code logic

A method for identifying a physical memory(ies) associated with a logical memory(ies) in a memory design can include (a) receiving a generic netlist for the memory design, (b) generating a test mode for the memory using the generic netlist, (c) determining the logical memory(ies); (d) performing a simulation on the test mode for the logical memory(ies); and (e) identifying the physical memory(ies) by tracing chip selects for the physical memory(ies) to the logical memory(ies). The identifying the physical memory(ies) may further include identifying which chip selects are active. The identifying the physical memory(ies) can further include tracing an address and a data pin(s) for the logical memory(ies) in the simulation. The identifying the physical memory(ies) can further include determining an address and a data pin(s) for the logical memory(ies) in the simulation.

System, method and computer-accessible medium for automated identification of embedded physical memories using shared test bus access in intellectual property cores

Systems and methods disclosed herein provide for improved diagnostics for memory built-in self-test ('MBIST'). Embodiments provide for a sequence iterator unit including a diagnostics analysis unit that monitors and reports on the failing read count associated with the tested memory. Embodiments further provide for a bit fail map report that is generated based on the failing read count.

Failing read count diagnostics for memory built-in self-test

Embodiments relate generally to a scalable, modularized mechanism which allows for storing programmable data streams on chip and provides repeatable on-demand issuances of data streams to one or more targeted instruments. In some embodiments, multiple data streams are grouped into data stream schedules to perform a series of programmable operations on demand. In these and other embodiments, data stream schedules can be reused and further grouped into data stream plans that can be executed in any order upon request or are hard-coded in a specific order.

On demand data stream controller for programming and executing operations in an integrated circuit

An exemplary fuse control arrangement can be provided, which can include, for example, a fuse control unit(s), which includes a test access method interface(s) and a programmable memory(ies), wherein the fuse control unit(s) is configured to provide fuse information to repair a memory(ies). The fuse control unit(s) can be coupled to the memory(ies) and the memory(ies) can be coupled to a register repair unit(s). The fuse control unit(s) can provide the register repair unit(s) with the fuse information to repair the memory(ies).

Multiple-channel, programmable fuse control unit

Systems and methods disclosed herein provide for improved diagnostics for memory built-in self-test ('MBIST'). Embodiments provide for a two-pass diagnostic test of the target memory, wherein, in the first pass, a data compare unit provides clock cycle values associated with detected mis-compares to a tester, and, in the second pass, the data compare unit extracts data vectors associated with the clock cycle values. Embodiments further provide for a bit fail map report that is generated based on the extracted data vectors.

Dynamic diagnostics analysis for memory built-in self-test

An exemplary system, method, and computer-accessible medium for modifying a memory unit(s) may be provided, which may include, for example, determining a location of a first memory built-in self-test (MBIST) logic(s) in the memory unit(s), removing the first MBIST logic(s) from the memory unit(s), and inserting a second MBIST logic(s) into the memory unit(s) at the location. The second MBIST logic(s) may be based on the first MBIST logic(s). The second MBIST logic(s) may be generated, which may be performed by modifying the first MBIST logic(s). The first MBIST logic(s) may be modified based on a modification(s) to a register transfer level (RTL) list associated with the memory unit(s). A pattern control file or a Test Data Register mapping file may be modified based on the modification to the first MBIST logic(s).

Register-transfer level design engineering change order strategy

Computer system for programmable built-in self-test (PMBIST) insertion into system-on-chip designs comprising one or more memories, including at least one processor and computer-executable instructions that cause the system to determine a PMBIST configuration based on one or more test configuration files; generate one or more package files based on the PMBIST configuration; insert PMBIST hardware into the SoC design based on the package files and characteristics of the memories; suspend PMBIST hardware insertion after an event related to the package files; and resume PMBIST hardware insertion after receiving one or more updated package files. In some embodiments, the package files are independent of vendor-specific memory models. In some embodiments, the package files comprise a plurality of data structures. Exemplary methods and computer-readable media can also be provided embodying one or more procedures the system is configured to perform.

Systems, methods, and computer-readable media utilizing improved data structures and design flow for programmable memory built-in self-test (PMBIST)

An exemplary bitmap file can be provided, which can include, for example, a map of a cell array structure of a memory(ies), a plurality of memory values superimposed on the cell array structure based on a simulated testing of the memory(ies). The memory values may be values being written to the memory(ies) while the memory(ies) is being tested. The memory values may be values in a test pattern(s) being used to test the memory(ies). Each cell in the cell array structure can have a particular memory value superimposed thereon. A cell(s) in the cell array structure may be highlighted, which may correspond to an incorrect memory value.

Verifying results in simulation through simulation add-on to support visualization of selected memory contents in real time

An exemplary memory arrangement can be provided, which can include, for example, a memory(ies), and an algorithmic memory unit(s) (AMU) coupled to the memory(ies), wherein the AMU includes a programmed testplan algorithm(s) configured to test the memory(ies). The AMU(s) can further include a hardwired testplan(s) configured to test the memory(ies). A Joint Test Action Group ('JTAG') controller may be coupled to the AMU(s), which can be configured to access logic of the programmed testplan algorithm(s). A direct access controller (DAC) can be coupled to the AMU(s), which can be configured to access internal nodes in the AMU(s). The DAC can be configured to activate the programmed testplan algorithm(s) using a minimally direct access pin interface in the AMU(s).

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Oswego, NY, United States of America

Steven Lee Gregor