Marvell Asia Pte., Ltd.

Steven Harley Lamphier

Eric D Hunt-Schroeder

Dale E Pontius

Christopher Kanyuck

An integrated circuit device includes functional circuitry including transistors, and testing circuitry configured to test effects of different layouts of the functional circuitry, relative to physical features of the integrated circuit device, on operation of the transistors. The testing circuitry includes at least one first test circuit having a first physical relationship relative to the physical features of the integrated circuit device, at least one second test circuit having a second physical relationship, different from the first physical relationship, relative to the physical features of the integrated circuit device, and sensing circuitry for reading outputs of the at least one first test circuit and the at least one second test circuit. Imbalance circuitry is configured to apply compensation to the functional circuitry to compensate for a sensed imbalance. There may be a plurality of instances of the first test circuit, and a plurality of instances of the second test circuit.

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Colchester, VT, United States of America

Steven Harley Lamphier