Nanometrics Inc.

Advanced Energy Industries, Inc.

Other

Pv Powered, Inc.

Steven G Hummel

John Michael Fife

Chris Raymond

Michael A Mills-Price

Mike Littau

Darren Forman

Tom Walker

Amit Shachaf

Andrzej Buczkowski

Brian John Hoffman

Tod Snider

Jon Ronhaar

Nicolas Laurent

Andrew Olseene

A temperature-controlled solar power inverter is described herein. The solar power inverter includes multiple components (for example, a power transistor, a control board, or a heat sink). The temperature of a component may rise due to heat generated by the component or heat absorbed from other components. The solar power inverter also includes a temperature sensor configured to measure a temperature at a location proximate to the component and a cooling device configured to cool the component. The solar power inverter also includes a controller coupled to the temperature sensor and the cooling device. The controller is programmed to receive the temperature from the temperature sensor and control the cooling device based upon the temperature and a temperature setpoint of the component. The temperature setpoint is based upon 1) a component initial temperature, 2) a temperature excursion limit of the component, and 3) an absolute temperature limit of the component.

Temperature-controlled solar power inverters

A system and method for operating a photovoltaic element at or near a maximum power point. A maximum power point tracker changes a voltage or current set point of a photovoltaic element in sequential discrete steps, measuring an output power at each step after a predetermined settling time. A slope of a power-voltage curve is then estimated and the slope is corrected for irradiance changes. Finally, an operating voltage or current of the photovoltaic element is adjusted based on the slope of the power-voltage curve and other factors, causing the photovoltaic element to operate at or near its maximum power.

System and method of determining maximum power point tracking for a solar power inverter

A cabinet for a solar power inverter is described. A solar power inverter receives DC current from a solar panel and transforms the DC current into AC current. To cool the inverter equipment, an air inlet receives ambient air drawn into the cabinet by an air pressurizer. The ambient air is urged into a pressurized air plenum, from which two ports channel the air into at least two air paths to flow over the equipment in the cabinet. The equipment in the cabinet is arranged such that the air passes over more heat-sensitive equipment before reaching less heat-sensitive equipment. The equipment in the cabinet can be separated by grounded, metal walls to contain and diminish electromagnetic interference. The equipment may be accessed from a single, front side of the cabinet.

Solar inverter cabinet architecture

In a measuring system, a method for evaluating parameters of a workpiece includes measuring a periodic structure, such as a grating, on the workpiece to produce image data. An orientation of features in the image data, produced by higher order diffractions from the periodic structure, is identified. An orientation of the periodic structure is determined based on the orientation of the features in the image data. The image data is then modified, based on the orientation of the periodic structure, to correlate with, and for comparison to, simulated image data to ascertain parameters of the workpiece. Alternatively, optical components in the measuring system, or the workpiece itself, are adjusted to provide a desired alignment between the optical components and the periodic structure. A microstructure on the workpiece may then be measured, and the resulting image data may be compared to the simulated image data to ascertain parameters of the microstructure.

Method for evaluating microstructures on a workpiece based on the orientation of a grating on the workpiece

A method and apparatus uses photoluminescence to identify defects in one or more specified material layers of a sample. One or more filtering elements are used to filter out predetermined wavelengths of return light emitted from a sample. The predetermined wavelengths are selected such that only return light emitted from one or more specified material layers of the sample is detected. Additionally or alternatively, the wavelength of incident light directed into the sample may be selected to penetrate the sample to a given depth, or to excite only one or more selected material layers in the sample. Accordingly, defect data characteristic of primarily only the one or more specified material layers is generated.

Photoluminescence imaging with preferential detection of photoluminescence signals emitted from a specified material layer of a wafer or other workpiece

A method for using photoluminescence to identify defects in a sub-surface region of a sample includes performing a first probe of the sample. A first data set, based on the first probe, is produced indicating defects located primarily in a surface layer of the sample. A second data set, based on a second probe, is produced indicating defects located in both the surface layer and a sub-surface region of the sample. The first data set is subtracted from the second data set to produce a third data set indicating defects located primarily in the sub-surface region of the sample. The first data set may optionally be normalized relative to the second data set before performing the subtraction. The first and second probes may advantageously be performed using a first laser and a second laser, respectively, having different wavelengths from each other.

Differential wavelength photoluminescence for non-contact measuring of contaminants and defects located below the surface of a wafer or other workpiece

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Bend, OR, United States of America

Steven G Hummel