Hewlett-packard Company

Steven G Eaton

Marvin S Keshner

Lawrence R Hanlon

A self-testing and self-repairing memory system is presented as well as a method for using it and a method for making it. This memory system is constructed from memory chips that have passed an abbreviated wafer probe test. After the memory system is assembled, it tests itself to locate defective memory cells. The memory system may decide to correct these defective memory cells or it may decide to correct them using an error correction code engine. This memory system tests itself during field use to locate defective memory cells. Once these defective memory cells are located, the memory system uses the error correction code engine to correct these defective memory cells. When the error correction code engine becomes overburdened with defective memory cells, then the memory system replaces these defective memory cells.

Defect tolerant self-testing self-repairing memory system

A data bus and data bus protocol for transferring messages is presented. The bus and bus protocol eliminate the need for a separate reset line. The bus and bus protocol transmit messages and messages separators on the same line.

Growing community of inventors

Mt. View, CA, United States of America

Steven G Eaton