Freescale Semiconductor,inc.

Philips Electronics North America Corporation

Steven E Cornelius

Thomas E Tkacik

Lonnie Calvin Goff

Matthew W Brocker

A method and apparatus for testing operation of a random number generator (RNG) testing circuit are provided. In accordance with at least one embodiment, a first RNG output value obtained from a RNG is stored in a first register. In response to activation of a test mode to simulate a faulty RNG, the first RNG output value is stored in a second register. The first RNG output value in the first register is compared to the first RNG output value in the second register. In response to the comparing, a RNG failure signal is provided at a RNG testing circuit output of the RNG testing circuit. In accordance with at least one embodiment, sequential and combinational logic can simulate a faulty RNG. Accordingly, simulation of a faulty RNG may be performed to test a RNG testing circuit even when the RNG is not faulty.

Method and apparatus for testing a random number generator tester

A cryptographic device includes a de-multiplexer, a plurality of encryption blocks, a plurality of permutation blocks, and a multiplexer. The encryption blocks encrypt data to produce encrypted data. The de-multiplexer receives data portions from a plaintext message and directs the data portions to one of the encryption blocks, based on a value within a path control session key. Each permutation block is associated with an encryption block. Each permutation block permutes encrypted data from the encryption block associated therewith. The multiplexer receives data portions from each of the plurality of permutation blocks to produce an encrypted output data stream.

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Gilbert, AZ, United States of America

Steven E Cornelius