Texas Instruments Corporation

Steven Derek Clynes

Eugene G Dierschke

Zhiliang Julian Chen

Anli Liu

Defective pixels in a CMOS array give rise to spot noise that diminishes the integrity of the resulting image. Because CMOS arrays and digital logic can be fabricated on the same integrated circuit using the same processing technology and relatively inexpensive and fast circuit can be employed to digitally filter the pixel data stream and to identify pixels having values that do not fall in the range defined by the immediately neighboring pixels and the deviate from the neighboring pixels by more than a threshold amount. Such conditions would indicate that the deviation is caused by a defective pixel rather than by desired image data. The threshold amount can be preprogrammed or can be provided by a user or can be dynamically set using feedback indicating image quality. The filter would also provide a solution for other sensors such as CCD, although a single chip solution would likely not be possible.

Defective pixel filtering for digital imagers

Image enhancement is automatically achieved by calibrating the reference voltage and gain of a differential amplifier and the integration interval so as to provide an input to a differential analog to digital converter (ADC) that utilizes the full dynamic range of the ADC. When used with a CMOS array, the imaging logic can be fabricated on a single chip with the array using combinational logic for fast, inexpensive calibration. Another advantageous feature is the ability to expand a desired portion of the luminance spectrum of the image in order to increase the digital resolution of the resulting image for that portion of the spectrum of interest.

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Allen, TX, United States of America

Steven Derek Clynes