Tektronix, Inc.

Steven C Herring

Kenneth P Dobyns

Gary J Waldo

Amy M Bergsieker

Kathryn A Engholm

Keith D Rule

Scott Ketterer

Evan A Dickinson

Lance H Forsberg

James L Tallman

Peter J Letts

Craig H Nelson

Lynne A Fitzsimmons

Ian S Dees

Tony Lee Tarr

Leif X Running

David A Sailor

Frederick Y Kawabata

Robert L Beasley

Alex J Barkume

Erik Teose

David Shanks

Ngoc Giao Tran

A test and measurement instrument including a plurality of input ports; an acquisition system coupled to the input ports and configured to acquire frequency domain data from the input ports; a user interface configured to present frequency domain controls for at least two of the input ports; and a controller configured to adjust frequency domain acquisition parameters of the acquisition system in response to the frequency domain controls such that frequency domain acquisition parameters associated with a first input port can be different from frequency domain acquisition parameters associated with a second input port.

Multi-channel frequency domain test and measurement instrument

A method of grouping multiple waveforms for a single channel of acquired data on a display area uses a graphic icon with the display area. The graphic icon has a first portion with a symbol indicating the single channel and with an indicator defining a baseline for the display area. The graphic icon also has a second portion with symbols indicating which of the multiple waveforms currently are being displayed. The symbol for the single channel and the symbol for a selected one of the multiple waveforms currently being displayed are highlighted. The highlighting may be via color, where the highlight color corresponds to the color of the waveforms currently being displayed.

Method of grouping waveforms for a single channel on a single display

A test and measurement instrument and method for generating IQ-based time domain waveform information and presenting the IQ-based time domain waveform information together with other time domain waveform on a common axis through a user interface. The test and measurement instrument can include, for example, one or more input terminals to receive an electrical signal under test, an analog-to-digital converter (ADC) to digitize the signal under test, a digital downconverter to produce I (in-phase) and Q (quadrature) baseband component information from the digitized signal, a memory configured to store the IQ baseband component information, a user interface, and a controller. The controller can be configured to generate an IQ-based time domain waveform using the IQ baseband component information, and present the IQ-based time domain waveform and a second time domain waveform on a common axis through the user interface.

Test and measurement instrument with common presentation of time domain data

A method of region overlap control for the display of a plurality of waveforms on an instrument includes an overlap function that allows selection by a user of a vertical height on a display screen for each of the waveforms. A ground marker for each of the waveforms is adjusted on the display screen according to the selected vertical height. The result is that the plurality of waveforms are displayed on the display screen in an overlapping fashion with sufficient vertical height to enhance triggering, all measurement functions and secondary functions, such as harmonics and switching loss measurements.

Region overlap control for autorange/autoset functions

A simple, integrated control for pan and zoom of a display of data represented by a very long data record is in the form of a control knob having an outer ring for controlling pan and an inner knob for controlling a zoom factor. A zoom function is turned ON either by turning the inner knob (setting the zoom factor to a default value) or by (i) pressing an adjacent zoom or pan button or (ii) turning the outer ring (setting the zoom factor to a prior value when the zoom function was turned OFF). The zoom function may be turned OFF by turning the inner knob to set the zoom factor to 1&#xd7; or by pressing the zoom button. The outer ring has individual positions divided into two groups: one group for controlling pan rate within a zoom window displaying a portion of the very long data record defined by a zoom box within a main window displaying the very long data record; and the other group for controlling pan rate of the zoom box within the main window for rapid movement from one end of the record to another.

Simple integrated control for zoom/pan functions

A test and measurement instrument includes a memory configured to store a digitized signal, a display configured to display the digitized signal, a mark interface configured to generate a mark creation signal, a processor coupled to the memory, the display, and the mark interface. The processor is configured to identify a feature of the digitized signal and create a mark indicating the feature and the digitized signal in response to the mark creation signal.

User-placed marks in a long record length waveform

In a test and measurement instrument having M signal input channels, individual samples representing a signal from each channel are compared to mask pixels to detect non-compliance with a given specification. Initial mask and waveform positions on a display screen of the oscilloscope are determined by an AUTOSET TO MASK function. Comparison of mask pixels and waveform pixels to detect collision between a waveform pixel and a mask pixel (i.e., a mask violation) is performed substantially in real time, as the pixels are being composited into a raster memory by a rasterizer. Acquisitions are performed simultaneously and repeatedly. Acquired waveforms from all M signal input channels are sequentially compared to the mask and drawn on screen during the following acquisition period. Thus, M waveforms can be tested for compliance with a telecom mask substantially within a single acquisition time period. A system employing a multiplexer can select M channels at a time from a group of N channels to decrease the time required to test all N channels. The intensity of pixels representing samples violating the mask is preferably increased for better visibility against the telecom mask.

Test and measurement instrument having multi-channel telecommunications mask testing capability

A portable general-purpose oscilloscope employs circuitry for receiving and converting serial digital video signals to composite and component analog signals via a digital to analog converter. The converted analog signals are applied to signal inputs of the oscilloscope for monitoring and display. Preferably, the oscilloscope is a digital phosphor oscilloscope. The oscilloscope control menus are arranged to control all of the usual functions of the oscilloscope and also to control the serial digital video circuitry. Apparatus is provided for storing data and waveforms. Circuitry is disclosed for deriving a trigger signal from a specific digital word of the serial digital bit stream. The trigger signal is applied to the trigger input terminal of the oscilloscope to allow the oscilloscope capture and display television waveform information around a unique occurrence of an event, as specified by the digital word. The serial digital to analog converter and decoder circuitry may be realized in a module that plugs into a receptacle in the oscilloscope. Separate modules may be provided for 601 video, HDTV signals, and DVB signals, and separate modules may be provided for NTSC, PAL, and SECAM television standards.

General purpose oscilloscope having digital television signal display capability

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Beaverton, OR, United States of America

Steven C Herring