International Business Machines Corporation

Sun Microsystems, Inc.

Steven Arthur Schmidt

Byron Lee Krauter

Michael Alexander Bowen

Talal K Jaber

Nayon Tomsio

Amy May Tuvell

Clay Chip Smith

Linda S Whitney

Disclosed are novel methods and apparatus for efficiently providing power buses and bump patterns with reduced inductance and/or resistance. In an embodiment, an apparatus is disclosed. The apparatus includes a plurality of power and ground bus pairs. Each power and ground bus pair may have a power bus and a ground bus. The apparatus further includes a first power bus from a first pair of the plurality of power and ground bus pairs. The first power bus may include a plurality of power bumps. The apparatus also includes a first ground bus from the first pair of the plurality of power and ground bus pairs. The first ground bus may include a plurality of ground bumps. Each of the plurality of power/ground bumps may be substantially equidistance from any immediately neighboring ground bump of the first ground bus.

Power grid and bump pattern with reduced inductance and resistance

An apparatus and method for determining power consumption in logic devices including mixed static and dynamic logic blocks is implemented. Input logical signals are tagged as having dynamical behavior or static behavior, and the power consumption of the logic block determined according to the behavior of the input signal. If an input signal has dynamic behavior, an output signal making a transition in response thereto will make two transitions per clock cycle, and the per cycle power consumption of the logic block is accordingly weighted. In another embodiment, a Boolean behavior signal is calculated for each block from clock phase tags and &ldquo;one cycle per cycle&rdquo; circuit level simulations. The per cycle power consumption of each logic block receives a weight in response to the Boolean behavior signal, according the behavior of the block characterized thereby.

Data processing system and method to estimate power in mixed dynamic/static CMOS designs

A system for testing a high speed integrated circuit includes a test device having a test clock with a first maximum frequency for performing level sensitive scan design (LSSD) testing of the integrated circuit device under test, a frequency multiplier circuit for multiplying the test clock signal to a higher second frequency capable of operating the device under test, and a finite state machine for generating a first internal clock for testing the device under test. In a practical embodiment, the internal clock speed may be running at a frequency many multiples of the test clock. Alternatively, a method of testing a device under test (DUT) at design speed includes running a predetermined group of tests with a test device operating at a lower speed than the design speed; incorporating LSSD or boundary scan test techniques in the device under test, together with a frequency multiplying device; generating a global clock for the device under test from the frequency multiplying circuit and using a finite state machine as a synchronizer and pulse generator to control a capture clock with respect to the global clock.

Reduced power apparatus and method for testing high speed components

Growing community of inventors

Leander, TX, United States of America

Steven Arthur Schmidt