Photon Dynamics, Inc.

Steven Aochi

Kent Nguyen

Gordon Yue

Kiran Jitendra

Neil Dang Nguyen

Lloyd Russell Jones

A probe system for facilitating inspection of a device under test comprising a plurality of panels, the probe system incorporating: a configurable universal probe bar comprising a plurality of probe blocks, the plurality of probe blocks comprising a plurality of probe pins positioned to simultaneously electrically engage a plurality of cell contact pads of the plurality of panels of the device under test to deliver a plurality of electrical test signals; and an alignment system configured to achieve an alignment of the plurality of probe pins with the plurality of the cell contact pads of the plurality of panels of the device under test.

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Morgan Hill, CA, United States of America

Steven Aochi