Tektronix, Inc.

Basf Se Corporation

Steven Alan Jacobs

Robert A Marsland, Jr

Florian Scharf

Markus Schwind

David Van Asten

A magnetocaloric cascade contains a sequence of magnetocaloric material layers having different Curie temperatures T, wherein the magnetocaloric material layers include a cold-side outer layer, a hot-side outer layer and at least three inner layers between the cold-side outer layer and the hot-side outer layer, and each pair of next neighboring magnetocaloric layers of the magnetocaloric cascade has a respective Curie-temperature difference amount &#x394;Tbetween their respective Curie temperatures, wherein the hot-side outer layer or the cold-side outer layer or both the hot-side and cold-side outer layer exhibits a larger ratio m&#x394;S/&#x394;Tin comparison with any of the inner layers, m denoting the mass of the respective magnetocaloric material layer and &#x394;Sdenoting a maximum amount of isothermal magnetic entropy change achievable in a magnetic phase transition of the respective magnetocaloric material layer.

Magnetocaloric cascade and method for fabricating a magnetocaloric cascade

A test and measurement system is disclosed. The system includes a data store with a data description of a received in-phase (I) quadrature (Q) symbol. The received IQ symbol is received from a transmitter associated with impairments, and the received IQ symbol is modified from a corresponding ideal IQ symbol by the impairments. A computer processor is coupled to the data store and generates an Error-Vector Magnitude (EVM) function that describes a difference between the received IQ symbol and the ideal IQ symbol in terms of a plurality of impairment parameters indicating the impairments. The processor then determines values for the impairment parameters that quantify the impairments. The values are determined by selection of values for the impairment parameters that minimize the EVM function.

Determination of constellation impairment parameters via error-vector magnitude minimization

Embodiments of the invention include methods and devices for determining a phase angle offset between a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT). Some embodiments include a laser source and an optical phase adjustor, which may be embodied by a loop stretcher structured to controllably stretch a length of fiber optic cable, driven by a phase adjust driver. In other embodiments the phase angle offset information is conveyed to an oscilloscope for internal compensation.

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Madison, WI, United States of America

Steven Alan Jacobs