Texas Instruments Corporation

Steve Edward Harrell

Erika Lynn Mazotti

Wai Lee

Karthik Kadirvel

Keith Eric Sanborn

Brian Lum-Shue-Chan

Matthew David Romig

Steven Aldred Kummerl

An electronic device, e.g. a trimmable resistor, includes a plurality of fused resistors, each fused resistor including one or more doped resistive regions formed in a semiconductor substrate. The doped resistive regions may be thermistors. Each fused resistor further includes a corresponding one of a plurality of fusible links. A first terminal of each of the fused resistors is connected to a first terminal of the corresponding fusible link. First and second interconnection buses are located over the substrate, with the first interconnection bus connecting to a second terminal of each of the fused resistors, and the second interconnection bus connecting to a second terminal of each of the fusible links. The plurality of fused resistors have resistance values that form an exponential progression.

Resistor with exponential-weighted trim

A thermistor-based thermal probe includes a thermistor die having a thermistor thereon with first and second bond pads coupled across the thermistor, and first and second die interconnects coupled to the respective bond pads. First and second wires W, Wthat extend beyond the thermistor die are attached to the first and to the second die interconnects, respectively. An encapsulant material encapsulates the thermistor die and a die end of the first and second wires.

Thermistor die-based thermal probe

Embodiments of the systems and methods of direct cell attachment for battery cells disclosed herein operate without the protection FETs and the protection IC, thereby enabling the direct attachment of battery cells to the system without compromising safety. A charger IC comprises a switching regulator whose output is used to charge the battery through a pass device. In example embodiments of the disclosed systems and methods of direct cell attachment, a combination of switching FETs and the pass device are used as a protection device instead of the charge and discharge FETs. During normal operation, the pass device may be used to charge the battery using the traditional battery charging profile. Under fault condition, the switching FETs and pass device may be driven appropriately to protect the system.

Systems and methods of direct cell attachment for batteries

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Corinth, TX, United States of America

Steve Edward Harrell