Optikos Corporation

Xenon Corporation

Stephen R Wilk

Stephen D Fantone

Saad Ahmed

Daniel J Braunstein

Jian Zhang

Brian W Anthony

Kevin M Sevigny

Systems are disclosed for providing ultraviolet (UV) energy to items on a processing surface. The system includes a lamp positioned over the processing surface to provide UV energy to the processing surface and a reflector cell positioned to cause UV energy emitted from the lamp in a direction away from the processing surface to be reflected toward the processing surface. The system includes the reflector cell having a reflector cap positioned above the lamp and a shroud extending downwardly from the reflector cap toward the conveyor wherein the shroud has a vertical dimension, a longitudinal dimension, and a horizontal dimension along the direction of the conveyor such that the horizontal dimension and the longitudinal dimension define a treatment area on the conveyor. The lamp is configured to deliver energy to the treatment area such that the delivered energy to the processing surface is substantially uniform over the treatment area.

Reflector for providing uniform light energy

Systems and methods are disclosed for protecting a UV-transmissive window. The system includes a first light source for emitting UV energy. The system also includes a UV transmissive window having a planar dimension and a thickness direction perpendicular to the planar dimension, the window positioned so that UV energy from the UV light source passes through the thickness dimension of the window. The system further includes a second light source for introducing a beam of light transverse to the thickness dimension of the window, a detector for detecting light received from the second light source after the light passes through the thickness dimension, and a control system responsive to changes in the detected light received from the second light source and configured to transmit an alert when a change in the detected light exceeds a threshold.

Protecting a UV-transmissive window

An automated apparatus and method for measuring properties of optical components based on wavefront sensing and analysis. A wavefront of predetermined profile is directed at a surface to be measured so that it is more or less distorted in accordance with the shape of the surface and the distorted wavefront is sensed and analyzed. From the information derived from the distorted wavefront and other knowledge of the relationship between the surface and position of the wavefront of predetermined profile, the shape of the surface may be inferred along with other properties such as radius of curvature, focal length, conic constants, asphericity, toricity, tilt, and decentering. Concave, convex, cylindrical, and flat parts may be measured along with wavefront errors in bandpass transmitting components such as lenses, filters, and windows.

Automated optical measurement apparatus and method

An automated apparatus and method for measuring properties of optical components based on wavefront sensing and analysis. A wavefront of predetermined profile is directed at a surface to be measured so that it is more or less distorted in accordance with the shape of the surface and the distorted wavefront is sensed and analyzed. From the information derived from the distorted wavefront and other knowledge of the relationship between the surface and position of the wavefront of predetermined profile, the shape of the surface maybe inferred along with other properties such as radius of curvature, focal length, conic constants, asphericity, toricity, tilt, and decentering. Concave, convex, cylindrical, and flat parts may be measured along with wavefront errors in bandpass transmitting components such as lenses, filters, and windows.

A process for measuring at least one parameter of an optical element having first and second surfaces on opposed sides thereof uses a reflection-reducing member, which is solid and has substantial mechanical integrity, but which is resilient and elastically deformable so as to conform to a surface with which it is placed in contact. This reflection-reducing member is contacted with the second surface of the optical element so that a surface of the reflection-reducing member conforms to this second surface, the parameter is measured, and the reflection-reducing member is removed from the second surface leaving this surface substantially free from any residue. The presence of the reflection-reducing member reduces or eliminates unwanted reflections from the second or &ldquo;back&rdquo; surface of the optical element, thus simplifying the measurement of any parameter which depends upon detecting reflection from the first or &ldquo;front&rdquo; surface of the optical element.

Method for temporary suppression of reflection for optical measurement

The height-of-fill of a container comprising a body having an optically detectable feature, and contents filling the body up to a fill level, at least a measuring portion of the container extending from the optically detectable feature to the fill level being capable of transmitting electromagnetic radiation, is determined by illuminating at least the measuring portion of the container with electromagnetic radiation; forming an image of part of this measuring portion of the container; and analyzing the image by data processing means to identify: (a) a first region having a first intensity that varies in accordance with the properties of the optically detectable feature; and (b) a second region having a second intensity that varies in accordance with the optical properties of the contents below the fill level, and determining the distance between a point within the first region and the upper edge of the second region, thereby determining the height-of-fill.

Growing community of inventors

Saugus, MA, United States of America

Stephen R Wilk