Raytheon Company

Georgia Tech Research Corporation

Brigham Young University

Stephen M Schultz

Thomas K Gaylord

Elias N Glytsis

Paul Albert Kohl

Delmar L Barker

James D Meindl

Muhannad S Bakir

Harry A Schmitt

Hollie K Reed

Chirag Suryakant Patel

Kevin P Martin

Tony Mule&prime;

Aaron Roe Hawkins

Nile F Hartman

Tony Mule′

Travis Oliphant

Ricardo Villalaz

A system and method for producing spectrally segmented images of object fields. In one embodiment the system includes an optical system that focuses light received from an object field along a focal plane with a field stop positioned within the optical system that has plural apertures for selectively transmitting the light from the object field. A diffractive element is positioned within the optical system to spectrally spread, along the focal plane, the light transmitted through the apertures. The apertures can be parallel slots or geometrically arranges holes. The plural apertures are spaced such that the spectrally spread light transmitted through any given aperture and incident upon the focal plane does not overlap on the focal plane with the light transmitted through any other aperture. The diffractive element may spread light across one or more directions. In one embodiment, a processor is coupled to a plurality of pixels in a focal plane array. A memory for storing image data organized as a hyper-spectral cube.

Segmented spectrum imaging system and method

The resolution and contrast of impedance measurements and scans are improved by using a non-contact impedance probe comprising an inner conductor configured to bear a measurement signal and an outer conductor configured to bear a shielding signal. The measurement signal and shielding signal are selected to increase the directionality of the flux emitted from the impedance probe. In one embodiment, the measurement signal and the shielding signal are phase locked signals. A sample may be placed in a basin having a conductive surface that receives the flux emitted from the impedance probe. By filling the basin with a conductive solution, direct contact between the probe and the sample may be avoided along with the associated variability in contact resistance. The small highly-directional flux emitting area achievable with the present invention enables high resolution high contrast non-contact scanning of biological and non-biological materials.

Scanned impedance imaging system method and apparatus

Wafer-level electronic packages having waveguides and methods of fabricating chip-level electronic packages having waveguides are disclosed. A representative chip-level electronic package includes at least one waveguide having a waveguide core. In addition, another representative chip-level electronic package includes a waveguide having an air-gap cladding layer around a portion of the waveguide core. A representative method for fabricating a chip-level electronic package includes: providing a substrate having a passivation layer disposed on the substrate; disposing a waveguide core on a portion of the passivation layer; disposing a first sacrificial layer onto at least one portion of the passivation layer and the waveguide core; disposing an overcoat layer onto the passivation layer and the first sacrificial layer; and removing the first sacrificial layer to define an air-gap cladding layer within the overcoat polymer layer and around a portion of the waveguide core.

Guided-wave optical interconnections embedded within a microelectronic wafer-level batch package

Optical interconnect layers and methods of fabrication thereof are described. In addition, the optical interconnect layers integrated into devices such as backplane (BP), printed wiring board (PWB), and multi-chip module (MCM) level devices are described. A representative optical interconnect layer includes a first cladding layer, a second cladding layer, one or more waveguides having a waveguide core and an air-gap cladding layer engaging a portion of waveguide core, wherein the first cladding layer and the second cladding layer engage the waveguide.

Backplane, printed wiring board, and/or multi-chip module-level optical interconnect layer having embedded air-gap technologies and methods of fabrication

A compensated radome is provided, comprising an inner layer of a negative index of refraction material, often referred to as a &ldquo;metamaterial&rdquo;, and an outer layer of a positive index of refraction material. The thickness of the two materials and their respective refractive indices are adjusted so that a beam of light passing through the radome is effectively not refracted. The metamaterial-compensated radomes solve the bore sight angle problem with a minimum of complexity.

Radome compensation using matched negative index or refraction materials

A method of absorbing microwave radiation is provided. The method comprises placing a structure in the path of the microwave radiation, the structure comprising an array of metal plates supported over a metal substrate by vertical conducting vias. The structure finds specific use in missiles having a dome portion that operates in a stealth mode. At least the inside of the dome portion is provided with the above-described structure for absorbing microwave radiation. The structure also finds use in anechoic chambers for use in testing microwave-emitting devices. Such anechoic chambers have walls, a floor, and a ceiling, which are provided with the above-described structure for absorbing microwave radiation. Surface patterning is thus used to enhance the micro-wave absorption. In addition, the frequency over which the material is highly absorptive can be shifted by changing the height of the structure, thus allowing active control (&ldquo;tunable in real time&rdquo;).

Microwave absorbing material

A method for measuring acceleration uses an accelerometer apparatus having an optically transparent, stress-birefringent material, a source of polarized light positioned to direct a polarized beam of light into the optically transparent, stress-birefringent material, and a detector system positioned to detect an output beam from the optically transparent, stress-birefringent material. The accelerometer apparatus is accelerated, and the acceleration of the accelerometer apparatus is simultaneously determined from a measurement of stress-induced optical birefringence in the optically transparent, stress-birefringent material.

Optical accelerometer and its use to measure acceleration

The present invention entails a volume grating for use as an optical coupler and method for creating the same which comprises a predetermined surface grating pattern having a decreasing surface grating period along a waveguide light propagation direction in the volume grating with a plurality of slanted grating fringes having a variable slant angle along the waveguide light propagation direction to focus coupled light in a first dimension with a predetermined light intensity profile along a grating-cover interface plane of the volume grating. In addition, the predetermined surface grating pattern further includes an increasing radius of curvature along the waveguide light propagation direction to focus the light in a second dimension. The present invention further comprises a system and method for designing the volume grating, as well as a system and method for designing an apparatus for fabricating the volume grating.

Growing community of inventors

Spanish Fork, UT, United States of America

Stephen M Schultz