Hitachi Global Storage Technologies Netherlands B.v.

Stephen L Eichblatt

Laurence S Samuelson

Xiao Z Wu

Mike Babin

Embodiments of the present invention include a method for measuring an angle between a first surface and a second surface of an object. The method includes rotating an object around a center axis of the object and shining a light source perpendicular to the center axis of the object. The method further includes measuring an intensity of a reflected light with respect to time and determining an angle between two or more surfaces of the object based on the intensity of the reflected light with respect to time.

System and method for angular measurement

A disposition process involves a part proceeding through a sequence of fabrication steps. The process involves obtaining a specified parameter for the part at an individual fabrication step; measuring the specified parameter of the part at the individual fabrication step; obtaining a final specified parameter for the part upon completion of the sequence of fabrication steps; and disposing the part at the individual fabrication step. Disposing the part uses a calculation of probability of the part meeting the final specified parameter.

On-line process specification adjusting and component disposing based on predictive model of component performance

Embodiments of the present invention pertain to methods of evaluating processes for manufacturing components. In one embodiment, an average probability of a first component to fail is calculated based on a measurement of a parameter where the first component was built using a new process. Another average probability of a second component to fail is calculated based on a measurement of the parameter where the second component was built using an existing process. A process index is calculated by determining a difference between the average probabilities for the second component and the first component. An estimation is made as to whether the new process is better than the existing process based on the process index.

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Matawan, NJ, United States of America

Stephen L Eichblatt