Siemens Communications, Inc.

Siemens Information & Communication Mobile, LLC

Stephen J Swain

David C Iglehart

Leland A Lester

William Joseph Beyda

Charles W Race, Jr

Marco Becker

Michael D Perrine

An apparatus and method are disclosed for connecting a headset microphone alternately to a telephone line and an alternative device. The apparatus includes a device connector for connecting the apparatus to the alternative device, a telephone connector for connecting the apparatus to the telephone line, and a microphone connector for connecting the apparatus to the microphone. The apparatus also includes a switching circuit connected to the device, telephone, and headset connectors. The switching circuit can be used with or included in a CTI module. The switching circuit connects the telephone connector to the headset connector in response to sensing a voltage greater than a predetermined threshold on the telephone line. When the voltage sensed returns to a value less than the predetermined threshold value, the switching circuit reconnects the headset connector to the device connector.

Automated microphone switch controlled by a CTI combo

A system and method are disclosed for automated testing of electronic devices. An original test is performed on a model product ( ) while the model product ( ) is coupled to a test recorder ( ). During the test, the model product ( ) is manipulated to invoke a desired response. As the test is performed, the manipulations and the desired responses are recorded by the test recorder ( ) in an executable format ( ). Subsequently, a test analyzer ( ) is coupled to a to-be-tested product ( ), and the executable recording ( ) of the test is played such that the to-be-tested product ( ) is manipulated as the model product ( ) had been manipulated during the original test. The to-be-tested product's ( ) responses to the manipulations are compared against the model product's responses ( ). Any difference between the to-be-tested product's ( ) responses and the model product's ( ) responses are identified.

System and method for automated testing of electronic devices

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Round Rock, TX, United States of America

Stephen J Swain