Intel Corporation

Stephen J Spinks

Andrew David Talbot

Nicholas Paul Cowley

Isaac Ali

Colin Leslie Perry

William L Barber

Keith Pinson

Mark S Mudd

Chi Man Kan

Alan J Martin

Matthew T Aitken

Colin Mair

In some embodiments, disclosed herein are approaches for facilitating voltage controlled slaved (or replica) clock circuits such as voltage controlled delay lines (VCDLs) off of a master clock generator. In such systems, one or more control (or bias) voltages are generated to control a master clock generator such as a master DLL. One or more 'slave' circuits may be controlled off of the master's control voltage so that their clocks replicate desired traits of the master clock.

Master/slave control voltage buffering

A dual mode voltage regulator according to one embodiment includes a passive regulator circuit, a switching regulator circuit, and a controller circuit configured to determine parameters of an external select input. The controller is configured to selectively couple, on a cold boot up, either the passive regulator circuit or the switching regulator circuit between an input voltage port and an output load based on the determination of parameters.

Dual mode voltage regulator with reconfiguration capability

A dual mode voltage regulator according to one embodiment includes a passive regulator circuit; a switching regulator circuit; and a controller circuit configured to monitor operational parameters of the dual mode voltage regulator and selectively couple either the passive regulator circuit or the switching regulator circuit between an input voltage port and an output load. The selective coupling is based on the monitoring of parameters including current through the output load, voltage at the input voltage port and voltage at the output load as well as the availability of a system clock signal.

Dual mode voltage regulator with dynamic reconfiguration capability

A circuit for testing digital-to-analog (DAC) and analog-to-digital converters (ADC) is provided. The circuit applies a code pattern having a plurality of sequential values to the digital to analog converter. A plurality of built-in test switches (BTS) couple at least one tap voltage from the DAC to a test bus and to the ADC as a variable reference input voltage. In one form, the circuit uses incremental digital codes to test for defects in a resistor string, a switch array, and a decode logic that form part of the DAC. In another form, the circuit uses the tap voltages from the DAC to test the comparators that form part of the ADC. Instead of performing time-consuming analog to digital conversions, the functionality of the above mentioned circuitry is tested by varying the code pattern around a reference point and by selecting the appropriate combination of BTS switches.

Apparatus, systems and methods for for digital testing of ADC/DAC combination

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Swindon, United Kingdom

Stephen J Spinks