National Technology & Engineering Solutions of Sandia, LLC

Sandia Corporation

The University of New Mexico

United Technologies Corporation

Stephen J Bauer

Timothy J Boyle

Fernando H Garzon

Jiann-Cherng Su

Steven F Glover

Khalid Mikhiel Hattar

Gary Pena

William Payton Gardner

Tom Pfeifle

Kenneth Martin Williamson

Scott Thomas Broome

Christine F Mcginnis

Systems and methods that measure material deformation by measuring a tracer gas that has been added to or is present in an engineered material that is subsequently released from the material, measured, and correlated to a change in a property of the material upon a stress/strain being applied to the engineered material.

Systems and methods for measuring material degradation

Ion-doped metal or ceramic nanoparticles can be added into, for example, a component that upon exposure to an environmental stimulus, will release the ion and 'tattle' on any impending destruction.

Tattletale ion-implanted nanoparticles

A device for electrofracturing a material sample and analyzing the material sample is disclosed. The device simulates an in situ electrofracturing environment so as to obtain electrofractured material characteristics representative of field applications while allowing permeability testing of the fractured sample under in situ conditions.

Electrofracturing test system and method of determining material characteristics of electrofractured material samples

Growing community of inventors

Albuquerque, NM, United States of America

Stephen J Bauer