Roche Diagnostics Hematology, Inc.

Roche Diagnostics Operations, Inc.

Stephen Conroy

David J Zahniser

Eric Yeaton

Michael R Zahniser

Russell Zahniser

Brian James McKeen

Dennis P Poole

Daniel C Lapen

Claudio Cherubini

James L Dowling

Mark J Licari

Rijk Edwin Oosterbroek

Ertan Ergezen

Frank Pawlowski

Eric Leknes

Eric D Yeaton

Brian J Mckeen

The disclosure features methods, fluid delivery platforms, and apparatus for preparing a sample on a substrate that includes a substrate handler configured to move a substrate between a first position and a second position, and a platform positioned so that when the substrate is in the second position, the platform faces the substrate, where the platform includes a fluid delivery area having a second surface formed from a hydrophilic material for which a water contact angle is 40 degrees or less, and a first surface facing the substrate when the substrate is in the second position, formed from a hydrophobic material for which a water contact angle is 100 degrees or more.

Sample processing systems and methods

The apparatus disclosed herein features a substrate arm and gripper, a platform having a top surface located opposite the substrate when the substrate arm is in a specimen processing position and featuring at least one fluid port located on a surface of the platform facing the substrate and at least one vacuum port located on the surface of the platform facing the substrate, and during operation, the apparatus is configured to (a) dispense a first quantity of fluid from the at least one fluid port to fill a separation between the substrate and the platform, (b) dispense an additional quantity of fluid from the at least one fluid port into the separation to displace a portion of the first quantity of fluid, and (c) remove the portion of the first quantity of fluid from the separation through the at least one vacuum port.

Automated systems and methods for preparing biological specimens for examination

Methods for dispensing a fluid sample on a substrate include obtaining an image of a sample applicator in proximity to the substrate, where the image includes a first image of the sample applicator and a second image of the sample applicator, determining a height of the sample applicator relative to a surface plane of the substrate based on a distance between common portions of the first and second images, and dispensing the fluid sample onto the substrate using the sample applicator, where the dispensing includes: translating the sample applicator, translating the substrate, or translating both the sample applicator and the substrate to effect a relative translation between the sample applicator and the substrate; and maintaining the sample applicator within 2 microns of a target height relative to the surface plane of the substrate during the translating.

Controlled dispensing of samples onto substrates

Sample application systems can include an extraction mechanism to remove a sample from sample containers, a sample vessel disposed on a deployment mechanism, where the deployment mechanism is arranged to move the sample vessel to receive a sample, an extraction mechanism washing station to wash the extraction mechanism, a sample applicator to remove a portion of the sample in the sample vessel and apply it onto a sample carrier, where the deployment mechanism can move the sample vessel to a sample application position, a sample vessel washing station to wash the sample vessel, where the deployment mechanism can move the sample vessel to the sample vessel washing station, a sample applicator washing station to wash the sample applicator after the sample has been dispensed onto the sample carrier, and a fluid control system to control flow of a fluid provided to the extraction mechanism and the sample applicator.

Fluid sample preparation systems and methods

Systems and methods for positioning a sample applicator relative to a substrate include: (a) obtaining an image of the sample applicator in proximity to the substrate, where the image includes a direct image region corresponding to the sample applicator and a first reflected image region corresponding to an image of the sample applicator reflected from a surface of the substrate; (b) determining a position of an edge of the sample applicator in the direct image region; (c) determining a position of a reflected edge of the sample applicator in the first reflected image region; (d) determining a distance between the edge of the sample applicator and the reflected edge of the sample applicator; and (e) determining the position of the sample applicator relative to the substrate based on the distance between the edges.

Sample applicator sensing and positioning

Growing community of inventors

Maynard, MA, United States of America

Stephen Conroy